SN54HC74, SN74HC74

SCLS094E – DECEMBER 1982 – REVISED DECEMBER 2015

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6 Specifications

6.1 Absolute Maximum Ratings

over operating free-air temperature range (unless otherwise noted)

(1)

MIN

MAX

UNIT

–0.5

7

V

±20

mA

±20

mA

Continuous output current

±25

mA

±50

mA

Junction temperature range

150

°C

–65

150

°C

(1)

Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings

only, and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating

conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.

(2)

The input and output voltage ratings may be exceeded if the input and output current ratings are observed.

6.2 ESD Ratings

VALUE

UNIT

±2000

Electrostatic discharge

V

Charged-device model (CDM), per JEDEC specification JESD22-

±1500

(1)

JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process. Manufacturing with

less than 500-V HBM is possible with the necessary precautions.

(2)

JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process. Manufacturing with

less than 250-V CDM is possible with the necessary precautions.

6.3 Recommended Operating Conditions

See

(1)

SN54HC74

SN74HC74

UNIT

MIN

NOM

MAX

MIN

NOM

MAX

Supply voltage

2

5

6

2

5

6

V

1.5

1.5

High-level input voltage

3.15

3.15

V

4.2

4.2

0.5

0.5

Low-level input voltage

1.35

1.35

V

1.8

1.8

Input voltage

0

0

V

Output voltage

0

0

V

1000

1000

∆t/∆v Input transition rise and fall time

500

500

ns

400

400

Operating free-air temperature

–55

125

–40

85

°C

(1)

Implications of Slow or Floating CMOS Inputs, SCBA004.

4

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