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TUSB4041I-Q1 Datasheet(PDF) 8 Page - Texas Instruments

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Part # TUSB4041I-Q1
Description  Four-Port USB 2.0 Hub
Download  44 Pages
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Manufacturer  TI1 [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI1 - Texas Instruments

TUSB4041I-Q1 Datasheet(HTML) 8 Page - Texas Instruments

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TUSB4041I-Q1
SLLSEK4B – JULY 2015 – REVISED JANUARY 2016
www.ti.com
Product Folder Links: TUSB4041I-Q1
Submit Documentation Feedback
Copyright © 2015–2016, Texas Instruments Incorporated
Pin Functions (continued)
PIN
I/O(1)
TYPE(1)
DESCRIPTION
NAME
NO.
TEST
17
I
PD
This pin is reserved for factory test.
POWER AND GROUND SIGNALS
NC
28
No connection, leave floating
40
VDD
19
PWR
1.1-V power rail
25
37
45
53
60
63
VDD33
2
PWR
3.3-V power rail
20
31
48
Thermal Pad
Ground. The thermal pad must be connected to ground.
(1)
Stresses beyond those listed as Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only,
and functional operation of the device at these or any other conditions beyond those indicated as Recommended Operating Conditions
is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
7 Specifications
7.1 Absolute Maximum Ratings
over operating free-air temperature (unless otherwise noted)
(1)
MIN
MAX
UNIT
Supply voltage
VDD steady-state supply voltage
–0.3
1.4
V
VDD33 steady-state supply voltage
–0.3
3.8
V
Voltage
USB_VBUS pin
–0.3
1.4
V
XI pins
–0.3
2.45
V
All other pins
–0.3
3.8
V
Storage temperature, Tstg
–65
150
°C
(1)
AEC Q100-002 indicates that HBM stressing shall be in accordance with the ANSI/ESDA/JEDEC JS-001 specification.
7.2 ESD Ratings
VALUE
UNIT
V(ESD)
Electrostatic discharge
Human-body model (HBM), per AEC Q100-002(1)
±2000
V
Charged-device model (CDM), per AEC Q100-011
±750


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