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SN65HVD11SHKQ Datasheet(PDF) 8 Page - Texas Instruments |
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SN65HVD11SHKQ Datasheet(HTML) 8 Page - Texas Instruments |
8 / 34 page SN65HVD11-HT SLLS934F – NOVEMBER 2008 – REVISED NOVEMBER 2015 www.ti.com 6.7 Driver Switching Characteristics over recommended operating conditions (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT Propagation delay time, low- tPLH 18 25 40 ns to-high-level output Propagation delay time, high- tPHL 18 25 40 ns to-low-level output TA = –55°C to 125°C 10 21 30 Differential output signal rise tr TA = 175°C (1) 10 22 30 ns RL = 54 Ω, time CL = 50 pF, TA = 210°C (2) 10 22 30 See Figure 13 TA = –55°C to 125°C 10 21 30 Differential output signal fall tf TA = 175°C (1) 10 22 30 ns time TA = 210°C (2) 10 22 30 tsk(p) Pulse skew (|tPHL – tPLH|) 2.5 ns tsk(pp) (3) Part-to-part skew (tPHL or tPLH) 11 ns Propagation delay time, high- RL = 110 Ω, tPZH impedance to high-level RE = 0 V, 55 ns output See Figure 14 Propagation delay time, high- tPHZ level to high-impedance 55 ns output RL = 110 Ω, Propagation delay time, high- tPZL RE = 0 V, 55 ns impedance to low-level output See Figure 15 Propagation delay time, low- tPLZ level to high-impedance 75 ns output RL = 110 Ω, Propagation delay time, tPZH RE = 3 V, 6 μs standby to high-level output See Figure 14 RL = 110 Ω, Propagation delay time, tPZL RE = 3 V, 6 μs standby to low-level output See Figure 15 (1) Minimum and maximum parameters are characterized for operation at TA = 175°C but may not be production tested at that temperature. Production test limits with statistical guardbands are used to ensure high temperature performance. (2) Minimum and maximum parameters are characterized for operation at TA = 210°C but may not be production tested at that temperature. Production test limits with statistical guardbands are used to ensure high temperature performance. (3) tsk(pp) is the magnitude of the difference in propagation delay times between any specified terminals of two devices when both devices operate with the same supply voltages, at the same temperature, and have identical packages and test circuits. 8 Submit Documentation Feedback Copyright © 2008–2015, Texas Instruments Incorporated Product Folder Links: SN65HVD11-HT |
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