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SN65HVD11SHKQ Datasheet(PDF) 8 Page - Texas Instruments

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Part # SN65HVD11SHKQ
Description  3.3-V RS-485 Transceiver
Download  34 Pages
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Manufacturer  TI1 [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI1 - Texas Instruments

SN65HVD11SHKQ Datasheet(HTML) 8 Page - Texas Instruments

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SN65HVD11-HT
SLLS934F – NOVEMBER 2008 – REVISED NOVEMBER 2015
www.ti.com
6.7 Driver Switching Characteristics
over recommended operating conditions (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
Propagation delay time, low-
tPLH
18
25
40
ns
to-high-level output
Propagation delay time, high-
tPHL
18
25
40
ns
to-low-level output
TA = –55°C to 125°C
10
21
30
Differential output signal rise
tr
TA = 175°C
(1)
10
22
30
ns
RL = 54 Ω,
time
CL = 50 pF,
TA = 210°C
(2)
10
22
30
See Figure 13
TA = –55°C to 125°C
10
21
30
Differential output signal fall
tf
TA = 175°C
(1)
10
22
30
ns
time
TA = 210°C
(2)
10
22
30
tsk(p)
Pulse skew (|tPHL – tPLH|)
2.5
ns
tsk(pp)
(3)
Part-to-part skew (tPHL or tPLH)
11
ns
Propagation delay time, high-
RL = 110 Ω,
tPZH
impedance to high-level
RE = 0 V,
55
ns
output
See Figure 14
Propagation delay time, high-
tPHZ
level to high-impedance
55
ns
output
RL = 110 Ω,
Propagation delay time, high-
tPZL
RE = 0 V,
55
ns
impedance to low-level output
See Figure 15
Propagation delay time, low-
tPLZ
level to high-impedance
75
ns
output
RL = 110 Ω,
Propagation delay time,
tPZH
RE = 3 V,
6
μs
standby to high-level output
See Figure 14
RL = 110 Ω,
Propagation delay time,
tPZL
RE = 3 V,
6
μs
standby to low-level output
See Figure 15
(1)
Minimum and maximum parameters are characterized for operation at TA = 175°C but may not be production tested at that temperature.
Production test limits with statistical guardbands are used to ensure high temperature performance.
(2)
Minimum and maximum parameters are characterized for operation at TA = 210°C but may not be production tested at that temperature.
Production test limits with statistical guardbands are used to ensure high temperature performance.
(3)
tsk(pp) is the magnitude of the difference in propagation delay times between any specified terminals of two devices when both devices
operate with the same supply voltages, at the same temperature, and have identical packages and test circuits.
8
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