P82B96

SCPS144C – MAY 2006 – REVISED MAY 2015

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TEST

PARAMETER

UNIT

CONDITIONS

MIN

MAX

MIN

MAX

Temperature coefficient of

Sx, Sy

–2

mV/°C

input thresholds

0.8

0.88

1

Low-level output voltage

Sx, Sy

V

0.67

0.73

0.79

Temperature coefficient of

Sx, Sy

–1.8

mV/°C

Quiescent supply current

0.9

1.8

2

mA

Additional supply current

Tx, Ty

1.7

2.75

3

mA

per pin low

Dynamic output sink

7

18

5.5

mA

Sx, Sy

0.1

1

1

μA

Dynamic output sink

Tx, Ty

60

100

60

mA

capability on buffered bus

Leakage current

2.5 V,

0.1

1

1

μA

on buffered bus

Sx, Sy

–1

1

Input current

–1

1

μA

from buffered bus

Rx, Ry

Leakage current

1

1.5

on buffered bus input

Input logic level high

0.65

0.7

Sx, Sy

Input logic level low

0.6

0.65

Input threshold

V

0.58 x

0.58 x

Input logic level high

0.5 x

Rx, Ry

Input threshold

0.42 x

0.42 x

Input logic level low

Input/output logic level

at 3 mA) –

Sx, Sy

100

150

100

mV

Sx, Sy

ramping, voltage on

1

1

V

buses are released

Tx, Ty

Tx, Ty lowered until

released

Temperature coefficient of release

–4

mV/°C

voltage

Input capacitance

Rx, Ry

2.5

4

4

pF

(1)

(2)

See the Typical Characteristics section of this data sheet.

(3)

The output logic low depends on the sink current.

(4)

The input logic threshold is independent of the supply voltage.

(5)

The minimum value requirement for pullup current, 200

While the tolerances on absolute levels allow a small probability that the low from one Sx output is recognized by an Sx input of another

P82B96, this has no consequences for normal applications.

6

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