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TLC555QDRQ1 Datasheet(PDF) 6 Page - Texas Instruments |
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TLC555QDRQ1 Datasheet(HTML) 6 Page - Texas Instruments |
6 / 25 page TLC555-Q1 SLFS078B – OCTOBER 2006 – REVISED OCTOBER 2015 www.ti.com 7.6 Electrical Characteristics: VDD = 15 V VDD = 15 V, at specified free-air temperature (unless otherwise noted) TEST PARAMETER TA (1) MIN TYP MAX UNIT CONDITIONS 25°C 9.45 10 10.55 VIT Threshold voltage V Full range 9.35 10.65 25°C 10 IIT Threshold current pA Full range 5000 25°C 4.65 5 5.35 VI(TRIG) Trigger voltage V Full range 4.55 5.45 25°C 10 II(TRIG) Trigger current pA Full range 5000 25°C 0.4 1.1 1.5 VI(RESET) Reset voltage V Full range 0.3 1.8 25°C 10 II(RESET) Reset current pA Full range 5000 Control voltage (open-circuit) as Full range 66.7% a percentage of supply voltage 25°C 0.77 1.7 Discharge-switch on-state IOL = 100 mA V voltage Full range 1.8 25°C 0.1 Discharge switch off-state nA current Full range 120 25°C 12.5 14.2 IOH = –10 mA Full range 12.5 25°C 13.5 14.6 VOH High-level output voltage IOH = –5 mA V Full range 13.5 25°C 14.2 14.9 IOH = –1 mA Full range 14.2 25°C 1.28 3.2 IOL = 100 mA Full range 3.8 25°C 0.63 1 VOL Low-level output voltage IOL = 50 mA V Full range 1.5 25°C 0.12 0.3 IOL = 10 mA Full range 0.45 25°C 360 600 IDD Supply current(2) μA Full range 1000 (1) Full-range TA is –40°C to 125°C. (2) These values apply for the expected operating configurations in which THRES is connected directly to DISCH or TRIG. 7.7 Operating Characteristics VDD = 5 V, TA = 25°C (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT VDD = 5 V to 15 V, CT = 0.1 μF, Initial error of timing interval(1) 1% 3% RA = RB = 1 kΩ to 100 kΩ (2) VDD = 5 V to 15 V, CT = 0.1 μF, Supply voltage sensitivity of timing interval 0.1 0.5 %/V RA = RB = 1 kΩ to 100 kΩ (2) tr Output pulse rise time RL = 10 MΩ, CL = 10 pF 20 75 ns tf Output pulse fall time RL = 10 MΩ, CL = 10 pF 15 60 ns fmax Maximum frequency in astable mode RA = 470 Ω, CT = 200 pF, RB = 200 Ω (2) 1.2 2.1 MHz (1) Timing interval error is defined as the difference between the measured value and the average value of a random sample from each process run. (2) RA, RB, and CT are as defined in Figure 1. 6 Submit Documentation Feedback Copyright © 2006–2015, Texas Instruments Incorporated Product Folder Links: TLC555-Q1 |
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