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54AC74 Datasheet(PDF) 4 Page - National Semiconductor (TI)

[Old version datasheet] Texas Instruments acquired National semiconductor.
Part No. 54AC74
Description  Dual D-Type Positive Edge-Triggered Flip-Flop
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Maker  NSC [National Semiconductor (TI)]
Homepage  http://www.national.com
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54AC74 Datasheet(HTML) 4 Page - National Semiconductor (TI)

   
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DC Characteristics for ’AC Family Devices (Continued)
54AC
Symbol
Parameter
V
CC
T
A =
Units
Conditions
(V)
−55˚C to +125˚C
Guaranteed
Limits
3.0
0.5
12 mA
4.5
0.5
V
I
OL
24 mA
5.5
0.5
24 mA
I
IN
Maximum Input
5.5
±1.0
µA
V
I =VCC, GND
Leakage Current
I
OLD
(Note 3) Minimum
Dynamic Output
Current
5.5
50
mA
V
OLD = 1.65V Max
I
OHD
5.5
−50
mA
V
OHD = 3.85V Min
I
CC
Maximum Quiescent
5.5
40.0
µA
V
IN =VCC
Supply Current
or GND
Note 2: All outputs loaded; thresholds on input associated with output under test.
Note 3: Maximum test duration 2.0 ms, one output loaded at a time.
Note 4: IIN and ICC @ 3.0V are guaranteed to be less than or equal to the respective limit @ 5.5V VCC.
ICC for 54AC @ 25˚C is identical to 74AC @ 25˚C.
DC Characteristics for ’ACT Family Devices
54ACT
Symbol
Parameter
V
CC
T
A =
Units
Conditions
(V)
−55˚C to +125˚C
Guaranteed
Limits
V
IH
Minimum High
Level Input
Voltage
4.5
2.0
V
V
OUT = 0.1V
5.5
2.0
or V
CC − 0.1V
V
IL
Maximum Low
Level Input
Voltage
4.5
0.8
V
V
OUT = 0.1V
5.5
0.8
or V
CC − 0.1V
V
OH
Minimum High
Level Output
Voltage
4.5
4.4
V
I
OUT = −50 µA
5.5
5.4
(Note 5)
V
IN =VIL or VIH
4.5
3.70
V
I
OH
−24 mA
5.5
4.70
−24 mA
V
OL
Maximum Low
Level Output
Voltage
4.5
0.1
V
I
OUT =50 µA
5.5
0.1
(Note 5)
V
IN =VIL or VIH
4.5
0.50
V
I
OL
24 mA
5.5
0.50
24 mA
I
IN
Maximum Input
5.5
±1.0
µA
V
I =VCC, GND
Leakage Current
I
CCT
Maximum
5.5
1.6
mA
V
I =VCC − 2.1V
I
CC/Input
I
OLD
(Note 6) Minimum
Dynamic Output
Current
5.5
50
mA
V
OLD = 1.65V Max
I
OHD
5.5
−50
mA
V
OHD = 3.85V Min
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