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LM35DH/NOPB Datasheet(PDF) 6 Page - Texas Instruments |
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LM35DH/NOPB Datasheet(HTML) 6 Page - Texas Instruments |
6 / 31 page LM35 SNIS159F – AUGUST 1999 – REVISED JANUARY 2016 www.ti.com 6.6 Electrical Characteristics: LM35A, LM35CA Unless otherwise noted, these specifications apply: −55°C ≤ TJ ≤ 150°C for the LM35 and LM35A; −40°C ≤ TJ ≤ 110°C for the LM35C and LM35CA; and 0°C ≤ TJ ≤ 100°C for the LM35D. VS = 5 Vdc and ILOAD = 50 μA, in the circuit of Full-Range Centigrade Temperature Sensor. These specifications also apply from 2°C to TMAX in the circuit of Figure 14. LM35A LM35CA PARAMETER TEST CONDITIONS UNIT MIN TYP MAX TYP TYP MAX ±0.2 ±0.2 TA = 25°C Tested Limit(2) ±0.5 ±0.5 Design Limit(3) ±0.3 ±0.3 TA = –10°C Tested Limit(2) Design Limit(3) ±1 Accuracy(1) °C ±0.4 ±0.4 TA = TMAX Tested Limit(2) ±1 ±1 Design Limit(3) ±0.4 ±0.4 TA = TMIN Tested Limit(2) ±1 Design Limit(3) ±1.5 ±0.18 ±0.15 TMIN ≤ TA ≤ TMAX, Nonlinearity(4) Tested Limit(2) °C –40°C ≤ TJ ≤ 125°C Design Limit(3) ±0.35 ±0.3 10 10 TMIN ≤ TA ≤ TMAX Tested Limit(2) 9.9 Design Limit(3) 9.9 Sensor gain mV/°C (average slope) 10 10 –40°C ≤ TJ ≤ 125°C Tested Limit(2) 10.1 Design Limit(3) 10.1 ±0.4 ±0.4 TA = 25°C Tested Limit(2) ±1 ±1 Design Limit(3) Load regulation(5) mV/mA 0 ≤ IL ≤ 1 mA ±0.5 ±0.5 TMIN ≤ TA ≤ TMAX, Tested Limit(2) –40°C ≤ TJ ≤ 125°C Design Limit(3) ±3 ±3 ±0.01 ±0.01 TA = 25°C Tested Limit(2) ±0.05 ±0.05 Design Limit(3) Line regulation(5) mV/V ±0.02 ±0.02 4 V ≤ VS ≤ 30 V, Tested Limit(2) –40°C ≤ TJ ≤ 125°C Design Limit(3) ±0.1 ±0.1 (1) Accuracy is defined as the error between the output voltage and 10 mv/°C times the case temperature of the device, at specified conditions of voltage, current, and temperature (expressed in °C). (2) Tested Limits are ensured and 100% tested in production. (3) Design Limits are ensured (but not 100% production tested) over the indicated temperature and supply voltage ranges. These limits are not used to calculate outgoing quality levels. (4) Non-linearity is defined as the deviation of the output-voltage-versus-temperature curve from the best-fit straight line, over the rated temperature range of the device. (5) Regulation is measured at constant junction temperature, using pulse testing with a low duty cycle. Changes in output due to heating effects can be computed by multiplying the internal dissipation by the thermal resistance. 6 Submit Documentation Feedback Copyright © 1999–2016, Texas Instruments Incorporated Product Folder Links: LM35 |
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