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54AC174 Datasheet(PDF) 4 Page - National Semiconductor (TI)

[Old version datasheet] Texas Instruments acquired National semiconductor.
Part No. 54AC174
Description  Hex D Flip-Flop with Master Reset
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Maker  NSC [National Semiconductor (TI)]
Homepage  http://www.national.com
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54AC174 Datasheet(HTML) 4 Page - National Semiconductor (TI)

   
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DC Characteristics for ’AC Family Devices (Continued)
54AC
Symbol
Parameter
V
CC
T
A =
Units
Conditions
(V)
−55˚C to +125˚C
Guaranteed Limits
I
CC
Maximum Quiescent
5.5
80.0
µA
V
IN = VCC
Supply Current
or GND
Note 2: All outputs loaded; thresholds on input associated with output under test.
Note 3: Maximum test duration 2.0 ms, one output loaded at a time.
Note 4: IIN and ICC @ 3.0V are guaranteed to be less than or equal to the respective limit @ 5.5V VCC.
ICC for 54AC @ 25˚C is identical to 74AC @ 25˚C.
DC Characteristics for ’ACT Family Devices
54ACT
Symbol
Parameter
V
CC
T
A =
Units
Conditions
(V)
−55˚C to +125˚C
Guaranteed Limits
V
IH
Minimum High Level
4.5
2.0
V
V
OUT = 0.1V
Input Voltage
5.5
2.0
or V
CC − 0.1V
V
IL
Maximum Low Level
4.5
0.8
V
V
OUT = 0.1V
Input Voltage
5.5
0.8
or V
CC − 0.1V
V
OH
Minimum High Level
4.5
4.4
V
I
OUT = −50 µA
Output Voltage
5.5
5.4
(Note 5)
V
IN = VIL or VIH
4.5
3.70
V
I
OH = −24 mA
5.5
4.70
I
OH = −24 mA
V
OL
Maximum Low Level
4.5
0.1
V
I
OUT = 50 µA
Output Voltage
5.5
0.1
(Note 5)
V
IN = VIL or VIH
4.5
0.50
V
I
OL =24mA
5.5
0.50
I
OL =24mA
I
IN
Maximum Input
5.5
±1.0
µA
V
I = VCC, GND
Leakage Current
I
CCT
Maximum
5.5
1.6
mA
V
I = VCC − 2.1V
I
CC/Input
I
OLD
Minimum Dynamic
Output Current (Note 6)
5.5
50
mA
V
OLD = 1.65V Max
I
OHD
5.5
−50
mA
V
OHD = 3.85V Min
I
CC
Maximum Quiescent
5.5
80.0
µA
V
IN = VCC
Supply Current
or GND
Note 5: All outputs loaded; thresholds on input associated with output under test.
Note 6: Maximum test duration 2.0 ms, one output loaded at a time.
Note 7: ICC for 54ACT @ 25˚C is identical to 74ACT @ 25˚C.
www.national.com
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