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LMV832MME Datasheet(PDF) 7 Page - Texas Instruments |
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LMV832MME Datasheet(HTML) 7 Page - Texas Instruments |
7 / 37 page LMV831, LMV832, LMV834 www.ti.com SNOSAZ6C – AUGUST 2008 – REVISED NOVEMBER 2015 Electrical Characteristics, 3.3 V (continued) Unless otherwise specified, all limits are specified for at TA = 25°C, V + = 3.3 V, V− = 0 V, V CM = V +/2, and R L = 10 kΩ to V +/2.(1) PARAMETER TEST CONDITIONS MIN(2) TYP(3) MAX(2) UNIT Common-mode 15 input capacitance CIN pF Differential-mode 20 input capacitance Total harmonic THD+N f = 1 kHz, AV = 1, BW ≥ 500 kHz 0.02% distortion + noise 6.6 Electrical Characteristics, 5 V Unless otherwise specified, all limits are specified for at TA = 25°C, V + = 5 V, V− = 0 V, V CM = V +/2, and R L = 10 kΩ to V +/2. (1) PARAMETER TEST CONDITIONS MIN(2) TYP(3) MAX(2) UNIT TA = 25°C ±0.25 ±1 VOS Input offset voltage(4) mV –40°C ≤ TA ≤ +125°C ±1.23 LMV831, ±0.5 ±1.5 Input offset voltage LMV832 TCVOS μV/°C temperature drift(4)(5) LMV834 ±0.5 ±1.7 TA = 25°C 0.1 10 IB Input bias current(5) pA –40°C ≤ TA ≤ +125°C 500 IOS Input offset current 1 pA TA = 25°C 77 93 Common-mode CMRR 0 V ≤ VCM ≤ V + −1.2 V dB rejection ratio(4) –40°C ≤ TA ≤ +125°C 77 TA = 25°C 76 93 Power supply 2.7 V ≤ V+ ≤ 5.5 V, PSRR dB rejection ratio(4) VOUT = 1 V –40°C ≤ TA ≤ +125°C 75 VRF_PEAK = 100 mVP (−20 dBP), 80 f = 400 MHz VRF_PEAK = 100 mVP (−20 dBP), 90 f = 900 MHz EMI rejection ratio, EMIRR dB IN+ and IN–(6) VRF_PEAK = 100 mVP (−20 dBP), 110 f = 1800 MHz VRF_PEAK=100 mVP (−20 dBP), 120 f = 2400 MHz Input common-mode CMVR CMRR ≥ 65 dB –0.1 3.8 V voltage range (1) Electrical Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very limited self-heating of the device such that TJ = TA. No specification of parametric performance is indicated in the electrical tables under conditions of internal self-heating where TJ > TA. (2) Limits are 100% production tested at 25°C. Limits over the operating temperature range are specified through correlations using statistical quality control (SQC) method. (3) Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary over time and will also depend on the application and configuration. The typical values are not tested and are not ensured on shipped production material. (4) The typical value is calculated by applying absolute value transform to the distribution, then taking the statistical average of the resulting distribution. (5) This parameter is specified by design and/or characterization and is not tested in production. (6) The EMI Rejection Ratio is defined as EMIRR = 20log ( VRF_PEAK/ΔVOS). Copyright © 2008–2015, Texas Instruments Incorporated Submit Documentation Feedback 7 Product Folder Links: LMV831 LMV832 LMV834 |
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