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54ABT240 Datasheet(PDF) 3 Page - National Semiconductor (TI)

[Old version datasheet] Texas Instruments acquired National semiconductor.
Part No. 54ABT240
Description  Octal Buffer/Line Driver with TRI-STATE Outputs
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Maker  NSC [National Semiconductor (TI)]
Homepage  http://www.national.com
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54ABT240 Datasheet(HTML) 3 Page - National Semiconductor (TI)

   
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Absolute Maximum Ratings (Note 1)
If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales Office/
Distributors for availability and specifications.
Storage Temperature
−65˚C to +150˚C
Ambient Temperature under Bias
−55˚C to +125˚C
Junction Temperature under Bias
Ceramic
−55˚C to +175˚C
V
CC Pin Potential to
Ground Pin
−0.5V to +7.0V
Input Voltage (Note 2)
−0.5V to +7.0V
Input Current (Note 2)
−30 mA to +5.0 mA
Voltage Applied to Any Output
in the Disabled or
Power-Off State
−0.5V to 5.5V
in the HIGH State
−0.5V to V
CC
Current Applied to Output
in LOW State (Max)
twice the rated I
OL (mA)
DC Latchup Source Current
(Across Comm Operating
Range)
−150 mA
Over Voltage Latchup (I/O)
10V
Recommended Operating
Conditions
Free Air Ambient Temperature
Military
−55˚C to +125˚C
Supply Voltage
Military
+4.5V to +5.5V
Minimum Input Edge Rate
(
∆V/∆t)
Data Input
50 mV/ns
Enable Input
20 mV/ns
Note 1: Absolute maximum ratings are values beyond which the device may
be damaged or have its useful life impaired. Functional operation under these
conditions is not implied.
Note 2: Either voltage limit or current limit is sufficient to protect inputs.
DC Electrical Characteristics
Symbol
Parameter
ABT240
Units
VCC
Conditions
Min
Typ
Max
VIH
Input HIGH Voltage
2.0
V
Recognized HIGH Signal
VIL
Input LOW Voltage
0.8
V
Recognized LOW Signal
VCD
Input Clamp Diode Voltage
−1.2
V
Min
IIN = −18 mA
VOH
Output HIGH Voltage
54ABT
2.5
V
Min
IOH = −3 mA
54ABT
2.0
V
Min
IOH = −24 mA
VOL
Output LOW Voltage
54ABT
0.55
V
Min
IOL = 48 mA
IIH
Input HIGH Current
5
µA
Max
VIN = 2.7V (Note 4)
5VIN = VCC
IBVI
Input HIGH Current Breakdown Test
7
µA
Max
VIN = 7.0V
IIL
Input LOW Current
−5
µA
Max
VIN = 0.5V (Note 4)
−5
VIN = 0.0V
VID
Input Leakage Test
4.75
V
0.0
IID = 1.9 µA
All Other Pins Grounded
IOZH
Output Leakage Current
50
µA
0 − 5.5V
VOUT = 2.7V; OEn = 2.0V
IOZL
Output Leakage Current
−50
µA
0 − 5.5V
VOUT = 0.5V; OEn = 2.0V
IOS
Output Short-Circuit Current
−100
−275
mA
Max
VOUT = 0.0V
ICEX
Output High Leakage Current
50
µA
Max
VOUT = VCC
IZZ
Bus Drainage Test
100
µA
0.0
VOUT = 5.5V; All Others GND
ICCH
Power Supply Current
50
µA
Max
All Outputs HIGH
ICCL
Power Supply Current
30
mA
Max
All Outputs LOW
ICCZ
Power Supply Current
50
µA
Max
OEn = VCC;
All Others at VCC or Ground
ICCT
Additional ICC/Input
Outputs Enabled
1.5
mA
Max
VI = VCC − 2.1V
Outputs TRI-STATE
1.5
mA
Enable Input VI = VCC − 2.1V
Outputs TRI-STATE
50
µA
Data Input VI = VCC − 2.1V
All Others at VCC or Ground
ICCD
Dynamic ICC
No Load
mA/
Max
Outputs Open
(Note 4)
0.1
MHz
OEn = GND, (Note 3)
One Bit Toggling, 50% Duty Cycle
Note 3: For 8 bits toggling, ICCD < 0.8 mA/MHz.
Note 4: Guaranteed, but not tested.
3
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