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54ABT16244 Datasheet(PDF) 3 Page - National Semiconductor (TI)

[Old version datasheet] Texas Instruments acquired National semiconductor.
Part No. 54ABT16244
Description  16-Bit Buffer/Line Driver with TRI-STATE Outputs
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Maker  NSC [National Semiconductor (TI)]
Homepage  http://www.national.com
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54ABT16244 Datasheet(HTML) 3 Page - National Semiconductor (TI)

 
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Absolute Maximum Ratings (Note 1)
Storage Temperature
−65˚C to +150˚C
Ambient Temperature under Bias
−55˚C to +125˚C
Junction Temperature under Bias
Ceramic
−55˚C to +175˚C
V
CC Pin Potential to
Ground Pin
−0.5V to +7.0V
Input Voltage (Note 2)
−0.5V to +7.0V
Input Current (Note 2)
−30 mA to +5.0 mA
Voltage Applied to Any Output
in the Disabled or
Power-off State
−0.5V to 5.5V
in the HIGH State
−0.5V to V
CC
Current Applied to Output
in LOW State (Max)
twice the rated I
OL (mA)
DC Latchup Source Current
−500 mA
Over Voltage Latchup (I/O)
10V
Recommended Operating
Conditions
Free Air Ambient Temperature
Military
−55˚C to +125˚C
Supply Voltage
Military
+4.5V to +5.5V
Minimum Input Edge Rate
(
∆V/∆t)
Data Input
50 mV/ns
Enable Input
20 mV/ns
Note 1: Absolute maximum ratings are values beyond which the device may
be damaged or have its useful life impaired. Functional operation under these
conditions is not implied.
Note 2: Either voltage limit or current limit is sufficient to protect inputs.
DC Electrical Characteristics
Symbol
Parameter
ABT16244
Units
V
CC
Conditions
Min Typ
Max
V
IH
Input HIGH Voltage
2.0
V
Recognized HIGH Signal
V
IL
Input LOW Voltage
0.8
V
Recognized LOW Signal
V
CD
Input Clamp Diode Voltage
−1.2
V
Min
I
IN = −18 mA
V
OH
Output HIGH Voltage
54ABT
2.5
V
Min
I
OH = −3 mA
54ABT
2.0
V
Min
I
OH = −24 mA
V
OL
Output LOW Voltage
54ABT
0.55
V
Min
I
OL = 48 mA
I
IH
Input HIGH Current
5
µA
Max
V
IN = 2.7V (Note 3)
5V
IN = VCC
I
BVI
Input HIGH Current
7
µA
Max
V
IN = 7.0V
Breakdown Test
I
IL
Input LOW Current
−5
µA
Max
V
IN = 0.5V (Note 3)
−5
V
IN = 0.0V
V
ID
Input Leakage Test
4.75
V
0.0
I
ID = 1.9 µA
All Other Pins Grounded
I
OZH
Output Leakage Current
50
µA
0 − 5.5V
V
OUT = 2.7V; OEn = 2.0V
I
OZL
Output Leakage Current
−50
µA
0 − 5.5V
V
OUT = 0.5V; OEn = 2.0V
I
OS
Output Short-Circuit Current
−100
−275
mA
Max
V
OUT = 0.0V
I
CEX
Output High Leakage Current
50
µA
Max
V
OUT = VCC
I
ZZ
Bus Drainage Test
100
µA
0.0
V
OUT = 5.5V
All Other Pins GND
I
CCH
Power Supply Current
2.0
mA
Max
All Outputs HIGH
I
CCL
Power Supply Current
60
mA
Max
All Outputs LOW
I
CCZ
Power Supply Current
2.0
mA
Max
OE
n = VCC
All Others at V
CC or GND
I
CCT
Additional I
CC/Input
Outputs Enabled
2.5
mA
V
I = VCC − 2.1V
Outputs TRI-STATE
2.5
mA
Max
Enable Input V
I = VCC − 2.1V
Outputs TRI-STATE
50
µA
Data Input V
I = VCC − 2.1V
All Others at V
CC or GND
I
CCD
Dynamic I
CC
No Load
mA/
Outputs Open, OE
n = GND
(Note 3)
0.1
MHz
Max
One Bit Toggling,
50% Duty Cycle
Note 3: Guaranteed but not tested.
3
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