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100328 Datasheet(PDF) 6 Page - National Semiconductor (TI)

[Old version datasheet] Texas Instruments acquired National semiconductor.
Part No. 100328
Description  Low Power Octal ECL/TTL Bi-Directional Translator with Latch
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Manufacturer  NSC [National Semiconductor (TI)]
Direct Link  http://www.national.com
Logo NSC - National Semiconductor (TI)

100328 Datasheet(HTML) 6 Page - National Semiconductor (TI)

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Military Version
ECL-to-TTL AC Electrical Characteristics
V
EE = −4.2V to −5.7V, VTTL = +4.5V to +5.5V, VCC = VCCA = GND, CL = 50 pF
Symbol
Parameter
T
C = −55˚C
T
C = 25˚C
T
C = +125˚C
Units
Conditions
Notes
Min
Max
Min
Max
Min
Max
t
PLH
E
n to Tn
2.1
6.0
2.0
5.6
2.2
6.3
ns
Figures 1, 2
(Notes 12, 13,
14)
t
PHL
(Transparent)
t
PLH
LE to T
n
3.1
7.0
3.1
6.5
3.3
7.5
ns
Figures 3, 4
t
PHL
t
PZH
OE to T
n
3.2
8.0
3.7
8.0
4.0
9.2
ns
Figures 3, 4
(Notes 12, 13,
14)
t
PZL
(Enable Time)
3.6
8.0
4.0
8.5
4.3
9.6
t
PHZ
OE to T
n
3.2
8.5
3.3
8.0
3.5
8.4
ns
Figures 3, 5
t
PLZ
(Disable Time)
3.0
8.0
3.4
7.5
4.1
10.0
t
PHZ
DIR to T
n
2.6
7.0
2.6
7.0
2.9
8.0
ns
Figures 3, 6
t
PLZ
(Disable Time)
2.7
7.0
3.1
7.0
4.0
10.0
t
set
E
n to LE
2.5
2.0
2.5
ns
Figures 3, 4
(Note 15)
t
hold
E
n to LE
3.0
2.5
3.0
ns
Figures 3, 4
t
pw(H)
Pulse Width LE
2.5
2.0
5.0
ns
Figures 3, 4
(Note 15)
Note 12: F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals −55˚C), then testing immedi-
ately after power-up. This provides “cold start” specs which can be considered a worst case condition at cold temperatures.
Note 13: Screen tested 100% on each device at +25˚C, temperature only, Subgroup A9.
Note 14: Sample tested (Method 5005, Table I) on each mfg. lot at +25˚C, Subgroup A9, and at +125˚C and −55˚C temperatures, Subgroups A10 and A11.
Note 15: Not tested at +25˚C, +125˚C and −55˚C temperature (design characterization data).
www.national.com
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