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100315 Datasheet(PDF) 2 Page - National Semiconductor (TI)

[Old version datasheet] Texas Instruments acquired National semiconductor.
Part No. 100315
Description  Low-Skew Quad Clock Driver
Download  6 Pages
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Maker  NSC [National Semiconductor (TI)]
Homepage  http://www.national.com
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100315 Datasheet(HTML) 2 Page - National Semiconductor (TI)

   
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Absolute Maximum Ratings (Note 2)
If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales Office/
Distributors for availability and specifications.
Above which the useful life may be impaired
Storage Temperature
−65˚C to +150˚C
Maximum Junction Temperature (T
J)
Ceramic
+175˚C
Case Temperature under Bias (T
C)
–55˚C to +125˚C
V
EE Pin Potential to Ground Pin
−7.0V to +0.5V
Input Voltage (DC)
V
CC to +0.5V
Output Current (DC Output HIGH)
−50 mA
Operating Range (Note 2)
−5.7V to −4.2V
ESD (Note 3)
≥2000V
Recommended Operating
Conditions
Case Temperature (T
C)
Military
−55˚C to +125˚C
Supply Voltage (V
EE)
−5.7V to −4.2V
Note 2: Absolute maximum ratings are those values beyond which the de-
vice may be damaged or have its useful life impaired. Functional operation
under these conditions is not implied.
Note 3: ESD testing conforms to MIL-STD-883, Method 3015.
Military Version
DC Electrical Characteristics
V
EE = −4.2V to −5.7V, VCC = VCCA = GND (Note 6)
Symbol
Parameter
Min
Typ
Max
Units
T
C
Conditions
Notes
V
OH
Output HIGH
−1025
−870
mV
0˚C to
V
IN = VIH(Max)
or V
IL(Min)
Loading with
50
Ω to −2.0V
(Notes
4, 5, 6)
Voltage
+125˚C
−1085
−870
mV
−55˚C
V
OL
Output LOW
−1830
−1620
mV
0˚C to
Voltage
+125˚C
−1830
−1555
mV
−55˚C
V
OHC
Output HIGH
−1035
mV
0˚C to
V
IN = VIH(Min)
or V
IL(Max)
Loading with
50
Ω to −2.0V
Voltage
+125˚C
−1085
mV
−55˚C
(Notes
4, 5, 6)
V
OLC
Output LOW
−1610
mV
0˚C to
Voltage
+125˚C
−1555
mV
−55˚C
DC Electrical Characteristics
V
EE = −4.2V to −5.7V, VCC = VCCA = GND (Note 6)
Symbol
Parameter
Min
Typ
Max
Units
T
C
Conditions
Notes
V
DIFF
Input Voltage
150
mV
−55˚C to
Required for Full
(Notes 4, 5,
6)
Differential
+125˚C
Output Swing
V
CM
Common Mode
V
CC − 2.0
V
CC − 0.5
V
−55˚C to
(Notes 4, 5,
6)
Voltage
+125˚C
V
IH
Single-Ended
−1165
−870
mV
−55˚C to
Guaranteed HIGH Signal
(Notes 4, 5,
6, 7)
Input High Voltage
+125˚C
for All Inputs
V
IL
Single-Ended
−1830
−1475
mV
−55˚C to
Guaranteed LOW Signal
(Notes 4, 5,
6, 7)
Input Low Voltage
+125˚C
for All Inputs
I
IH
Input HIGH Current
150
µA
−55˚C to
V
IN = VIH(Max)
(Notes 4, 5,
6)
CLKIN, CLKIN
+125˚C
TCLK
450
µA
CLKSEL
380
µA
I
CBO
Input Leakage
−10
µA
−55˚C to
V
IN = VEE
(Notes 4, 5,
6)
Current
+125˚C
I
EE
Power Supply
−80
−25
mA
−55˚C to
(Notes 4, 5,
6)
Current, Normal
+125˚C
Note 4: F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals −55˚C), then testing immediately
without allowing for the junction temperature to stabilize due to heat dissipation after power-up. This provides “cold start” specs which can be considered a worst case
condition at cold temperatures.
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