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ISO7330CQDWQ1 Datasheet(PDF) 11 Page - Texas Instruments |
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ISO7330CQDWQ1 Datasheet(HTML) 11 Page - Texas Instruments |
11 / 30 page C = 0.1 F ±1% IN V OH or VOL OUT V CCI + – V CM V CCO C = 0.1 F ±1% GNDO GNDI S1 + – Pass-fail criteria – output must remain stable. C L Note A VO OUT IN IN = 0 V (Devices without suffix F) IN = V (Devices with suffix F) CCI See Note A CL VI 0 V t fs fs high VO VI 2.7 V 50% VCCI VCCI VOL VOH fs low ISO7330-Q1, ISO7331-Q1 www.ti.com SLLSER7 – NOVEMBER 2015 Parameter Measurement Information (continued) A. CL = 15 pF and includes instrumentation and fixture capacitance within ±20%. Figure 13. Fail-Safe Output Delay-Time Test Circuit and Voltage Waveforms A. CL = 15 pF and includes instrumentation and fixture capacitance within ±20%. Figure 14. Common-Mode Transient Immunity Test Circuit Copyright © 2015, Texas Instruments Incorporated Submit Documentation Feedback 11 Product Folder Links: ISO7330-Q1 ISO7331-Q1 |
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