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LM27222M Datasheet(PDF) 4 Page - Texas Instruments |
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LM27222M Datasheet(HTML) 4 Page - Texas Instruments |
4 / 16 page LM27222 SNVS306B – SEPTEMBER 2004 – REVISED MARCH 2013 www.ti.com Electrical Characteristics (1) VCC = CB = 5V, SW = GND = 0V, unless otherwise specified. Typicals and limits appearing in plain type apply for TA = TJ = +25°C. Limits appearing in boldface type apply over the entire operating temperature range (-40°C ≤ TJ ≤ 125°C). Symbol Parameter Conditions Min Typ Max Units POWER SUPPLY Iq_op Operating Quiescent Current IN = 0V, LEN = 0V 5 15 µA 30 IN = 0V, LEN = 5V 500 540 650 µA 825 HIGH-SIDE DRIVER Peak Pull-up Current 3 A RH-pu Pull-up Rds_on ICB = IHG = 0.3A 0.9 2.5 Ω Peak Pull-down Current 4.5 A RH-pd Pull-down Rds_on ISW = IHG = 0.3A 0.4 1.5 Ω t4 Rise Time Timing Diagram, CLOAD = 3.3nF 17 ns t6 Fall Time Timing Diagram, CLOAD = 3.3nF 12 ns t3 Pull-up Dead Time Timing Diagram 9.5 ns t5 Pull-down Delay Timing Diagram 16.5 ns ton_min Minimum Positive Output 30 ns Pulse Width LOW-SIDE DRIVER Peak Pull-up Current 3.2 A RL-pu Pull-up Rds_on IVCC = ILG = 0.3A 0.9 2.5 Ω Peak Pull-down Current 4.5 A RL-pd Pull-down Rds_on IGND = ILG = 0.3A 0.4 1.5 Ω t8 Rise Time Timing Diagram, CLOAD = 3.3nF 17 ns t2 Fall Time Timing Diagram, CLOAD = 3.3nF 14 ns t7 Pull-up Dead Time Timing Diagram 11.5 ns t1 Pull-down Delay Timing Diagram 7.7 ns PULL-DOWN RESISTANCES HG-SW Pull-down Resistance 10k Ω LG-GND Pull-down 10k Ω Resistance LEN-GND Pull-down 150K Ω Resistance IN-GND Pull-down Resistance 150K Ω LEAKAGE CURRENTS Ileak_IN IN pin Leakage Current IN = 0V, Source Current 50 nA IN = 5V, Sink Current 33 µA Ileak_LEN LEN pin Leakage Current LEN = 0V, Source Current 200 nA LEN = 5V, Sink Current 33 µA LOGIC VIH_LEN LEN Low to High Threshold Low to High Transition 65 % of VCC VIL_LEN LEN High to Low Threshold High to Low Transition 30 % of VCC VIH_IN IN Low to High Threshold Low to High Transition 65 % of VCC VIL_IN IN High to Low Threshold High to Low Transition 30 % of VCC Threshold Hysteresis 0.7 V (1) Min and Max limits are 100% production tested at 25°C. Limits over the operating temperature range are ensured through correlation using Statistical Quality Control (SQC) methods. Limits are used to calculate Average Outgoing Quality Level (AOQL). 4 Submit Documentation Feedback Copyright © 2004–2013, Texas Instruments Incorporated Product Folder Links: LM27222 |
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