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TLV5638 Datasheet(PDF) 6 Page - Texas Instruments

Part No. TLV5638
Description  2.7-V TO 5.5-V LOW-POWER DUAL 12-BIT DIGITAL-TO-ANALOG CONVERTER WITH INTERNAL REFERENCE AND POWER DOWN
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Manufacturer  TI [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI - Texas Instruments

TLV5638 Datasheet(HTML) 6 Page - Texas Instruments

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ELECTRICAL CHARACTERISTICS (Continued)
DIGITAL INPUT TIMING REQUIREMENTS
PARAMETER MEASURMENT INFORMATION
twL
SCLK
CS
DIN
D15
D14
D13
D12
D1
D0
X
X
1
X
2
3
4
5 15
16
X
twH
tsu(D)
th(D)
tsu(CS-CK)
tsu(C16-CS)
TLV5638
SLAS225C – JUNE 1999 – REVISED JANUARY 2004
over recommended operating conditions, V
ref = 2.048 V, Vref= 1.024 V (unless otherwise noted)
ANALOG OUTPUT DYNAMIC PERFORMANCE
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
Fast
1
3
ts(FS)
Output settling time, full scale
RL = 10 kΩ, CL = 100 pF, See(1)
µs
Slow
3.5
7
Fast
0.5
1.5
ts(CC)
Output settling time, code to code
RL = 10 kΩ, CL = 100 pF, See (2)
µs
Slow
1
2
Fast
12
SR
Slew rate
RL = 10 kΩ, CL = 100 pF, See (3)
V/µs
Slow
1.8
Glitch energy
DIN = 0 to 1, FCLK = 100 kHz, CS = VDD
5
nV-s
SNR
Signal-to-noise ratio
69
74
S/(N+D) Signal-to-noise + distortion
58
67
fs = 480 kSPS, fout = 1 kHz, RL = 10 kΩ,
dB
CL = 100 pF
THD
Total harmonic distortion
69
57
Spurious free dynamic range
57
72
(1)
Settling time is the time for the output signal to remain within ±0.5 LSB of the final measured value for a digital input code change of
0x020 to 0xFDF and 0xFDF to 0x020 respectively. Not tested, assured by design.
(2)
Settling time is the time for the output signal to remain within ± 0.5 LSB of the final measured value for a digital input code change of
one count. Not tested, assured by design.
(3)
Slew rate determines the time it takes for a change of the DAC output from 10% to 90% full-scale voltage.
MIN
NOM
MAX
UNIT
tsu(CS-CK)
Setup time, CS low before first negative SCLK edge
10
ns
tsu(C16-CS)
Setup time, 16th negative SCLK edge (when D0 is sampled) before CS rising edge
10
ns
twH
SCLK pulse width high
25
ns
twL
SCLK pulse width low
25
ns
tsu(D)
Setup time, data ready before SCLK falling edge
10
ns
th(D)
Hold time, data held valid after SCLK falling edge
5
ns
Figure 1. Timing Diagram
6


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