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TLV5636 Datasheet(PDF) 5 Page - Texas Instruments |
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TLV5636 Datasheet(HTML) 5 Page - Texas Instruments |
5 / 24 page ![]() www.ti.com ELECTRICAL CHARACTERISTICS TIMING REQUIREMENTS TLV5636 SLAS223C – JUNE 1999 – REVISED APRIL 2004 over recommended operating free-air temperature range, supply voltages, and reference voltages (unless otherwise noted) ANALOG OUTPUT DYNAMIC PERFORMANCE PARAMETER TEST CONDITIONS MIN TYP MAX UNIT Fast 1 3 RL = 10 kΩ, ts(FS) Output settling time (full scale) CL = 100 pF, µs see note(1) Slow 3.5 7 Fast 0.5 1.5 RL = 10 kΩ, ts(CC) Output settling time, code to code CL = 100 pF, µs see note(2) Slow 1 2 Fast 8 RL = 10 kΩ, SR Slew rate CL = 100 pF, V/µs see note(3) Slow 1.5 DIN = 0 to 1, fout = 1 kHz, Glitch energy 5 nV-s CS = VDD SNR Signal-to-noise ratio 71 75 S/(N+D) Signal-to-noise + distortion 59 66 fs = 480 kSPS, fout = 1 kHz, dB RL = 10 kΩ, CL = 100 pF THD Total harmonic distortion -67 -59 Spurious free dynamic range 59 69 (1) Settling time is the time for the output signal to remain within +0.5 LSB of the final measured value for a digital input code change of 0x20 to 0xFDF and 0xFDF to 0x020 respectively. Assured by design; not tested. (2) Settling time is the time for the output signal to remain within +0.5 LSB of the final measured value for a digital input code change of one count. Assured by design; not tested. (3) Slew rate determines the time it takes for a change of the DAC output from 10% to 90% full-scale voltage. DIGITAL INPUTS MIN NOM MAX UNIT tsu(CS-FS) Setup time, CS low before FS falling edge 10 ns tsu(FS-CK) Setup time, FS low before first negative SCLK edge 8 ns Setup time, 16th negative edge after FS low on which bit D0 is sampled before tsu(C16-FS) 10 ns rising edge of FS. Setup time, 16th positive SCLK edge (first positive after D0 is sampled) before CS tsu(C16-CS) rising edge. If FS is used instead of 16th positive edge to update DAC, then setup 10 ns time between FS rising edge and CS rising edge. twH SCLK pulse duration high 25 ns twL SCLK pulse duration low 25 ns tsu(D) Setup time, data ready before SCLK falling edge 8 ns th(D) Hold time, data held valid after SCLK falling edge 5 ns twH(FS) FS duration high 25 ns 5 |
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