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NCP6133MNTWG Datasheet(PDF) 9 Page - ON Semiconductor

Part # NCP6133MNTWG
Description  Phase Controller 1/0 Phase Controller
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Manufacturer  ONSEMI [ON Semiconductor]
Direct Link  http://www.onsemi.com
Logo ONSEMI - ON Semiconductor

NCP6133MNTWG Datasheet(HTML) 9 Page - ON Semiconductor

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NCP6133
http://onsemi.com
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NCP6133 ELECTRICAL CHARACTERISTICS Unless otherwise stated: −10°C < TA < 100°C; VCC = 5 V; CVCC = 0.1 mF
Parameter
Unit
Max
Typ
Min
Test Conditions
OVERCURRENT PROTECTION (Core Rail)
ILIM Threshold Current (immediate OCP shutdown)
(PS1, PS2, PS3) Rlim = 20 k, N =
number of phases in PS0 mode
15/N
mA
Maximum Timer for OCP shutdown
55
ms
OVERCURRENT PROTECTION (+1 Rail)
ILIM Threshold Current (OCP shutdown after 50 ms delay)
(PS0,1,2,3) Rlim = 20 k
9
10
11
mA
ILIM Threshold Current (immediate OCP shutdown)
(PS0,1,2,3) Rlim = 20 k
12.5
15
16.5
mA
Maximum Timer for OCP shutdown
55
ms
CSCOMP OCP Threshold
220
mV
VRMP (VIN Monitor)
UVLO Threshold
VRMP falling
3.0
3.2
3.4
V
UVLO Hysteresis
600
800
mV
Leakage current
VEN = 0 V, VVRMP = 26 V
0.5
mA
MODULATORS (PWM COMPARATORS) FOR CORE AND AUX
0% Duty Cycle
COMP voltage when the PWM
outputs remain LO
1.3
V
100% Duty Cycle
COMP voltage when the PWM
outputs remain HI VRMP = 12.0 V
3.1
V
PWM Ramp Duty Cycle Matching
COMP = 2 V, PWM Ton matching
1
%
PWM Phase Angle Error
Between adjacent phases
−15
15
°
Ramp Feed−forward Voltage range
5
20
V
TRBST, TRBSTA
TRBST/COMP offset
TRBST Starts Sinking Current
350
mV
TRBST Sink Capability
500
mA
TRBSTA/COMPA offset
TRBST Starts Sinking Current
350
mV
TRBSTA Sink Capability
500
mA
VR_HOT#
Output Low Voltage
I_VRHOT = −4 mA
0.3
V
Output Leakage Current
High Impedance State
−1.0
1.0
mA
TSENSE/TSENSEA
Alert# Assert Threshold
497
mV
Alert# De−assert Threshold
512
mV
VRHOT Assert Threshold
477
mV
VRHOT Rising Threshold
491
mV
TSENSE Bias Current
114
120
126
mA
ADC
Voltage Range
0
2
V
Total Unadjusted Error (TUE)
−1
+1
%
Differential Nonlinearity (DNL)
8−bit
1
LSB
Power Supply Sensitivity
±1
%
Conversion Time
30
ms
Round Robin
90
ms
3. Guaranteed by design or characterization data, not in production test.


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