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SM73307 Datasheet(PDF) 4 Page - Texas Instruments |
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SM73307 Datasheet(HTML) 4 Page - Texas Instruments |
4 / 25 page SM73307 SNOSB88B – JUNE 2011 – REVISED APRIL 2013 www.ti.com 5V Electrical Characteristics Unless otherwise specified, all limits are specified for TA = 25°C, V + = 5V, V− = 0V, V CM = V +/2. Boldface limits apply at the temperature extremes. Symbol Parameter Conditions Min(1) Typ(2) Max(1) Units ±150 −20°C ≤ TA ≤ 85°C ±10 ±300 VOS Input Offset Voltage μV ±150 −40°C ≤ TA ≤ 125°C ±10 ±400 Input Offset Voltage Temperature TC VOS –1.75 ±4 μV/°C Drift(3)(4) 1 −40°C ≤ TA ≤ 85°C 0.1 25 IB Input Bias Current VCM = 2.0V (5) (4) pA 1 −40°C ≤ TA ≤ 125°C 0.1 100 0.5 IOS Input Offset Current VCM = 2.0V (4) 0.01 pA 50 85 CMRR Common Mode Rejection Ratio 0V ≤ VCM ≤ 3.7V 100 dB 82 2.0V ≤ V+ ≤ 5.5V 85 100 V− = 0V, VCM = 0 80 PSRR Power Supply Rejection Ratio dB 1.8V ≤ V+ ≤ 5.5V 85 98 V− = 0V, VCM = 0 CMRR ≥ 80 dB −0.3 4 CMVR Common Mode Voltage Range V CMRR ≥ 78 dB –0.3 4 VO = 0.3 to 4.7V 84 90 RL = 2 kΩ to V +/2 80 AVOL Open Loop Voltage Gain dB VO = 0.3 to 4.7V 90 95 RL = 10 kΩ to V +/2 86 70 RL = 2 kΩ to V +/2 32 77 Output Voltage Swing High 60 RL = 10 kΩ to V +/2 22 66 mV from VOUT either rail 75 RL = 2 kΩ to V +/2 45 78 Output Voltage Swing Low 60 RL = 10 kΩ to V +/2 20 62 Sourcing to V− 46 66 VIN = 200 mV (6) 38 IOUT Output Current mA Sinking to V+ 10.5 23 VIN = −200 mV (6) 6.5 1.70 IS Supply Current (per channel) 1.30 mA 2.05 (1) Limits are 100% production tested at 25°C. Limits over the operating temperature range are specified through correlations using the Statistical Quality Control (SQC) method. (2) Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary over time and will also depend on the application and configuration. (3) Offset voltage average drift is determined by dividing the change in VOS at the temperature extremes by the total temperature change. (4) This parameter is specified by design and/or characterization and is not tested in production. (5) Positive current corresponds to current flowing into the device. (6) The short circuit test is a momentary open loop test. 4 Submit Documentation Feedback Copyright © 2011–2013, Texas Instruments Incorporated Product Folder Links: SM73307 |
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