NB3N111K

http://onsemi.com

5

Symbol

Characteristic

Min

Typ

Max

Unit

725

1000

mV

Propagation Delay (See Figure 3a)

CLK/CLK to Qx/Qx

550

800

1100

ps

Propagation Delay Variation Per Each Diff Pair

(Note 7) (See Figure 3a)

CLK/CLK to Qx/Qx

100

ps

Duty Cycle Skew (Note 8)

Within −Device Skew

Device to Device Skew (Note 9)

20

100

150

ps

Additive Integrated Phase Jitter at Fc = 100 MHz (Note 10)

0.1

ps

Input Voltage Swing/Sensitivity

(Differential Configuration)

0.150

0.85

V

Absolute Crossing Magnitude Voltage (See Figure 3b)

250

550

mV

150

mV

Absolute Magnitude in Output Risetime and Falltime (from 175 mV to 525 mV)

(See Figure 3b)

Qx, Qx

150

220

400

ps

Dtr, Dtf

Variation in Magnitude of Risetime and Falltime (Single−Ended) (See Figure 3b)

Qx, Qx

125

ps

NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit

board with maintained transverse airflow greater than 500 lfpm. Electrical parameters are guaranteed only over the declared

operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification limit

values are applied individually under normal operating conditions and not valid simultaneously.

from IREF (Pin 1) to GND. See Figure 6.

7. Measured from the input pair crosspoint to each single output pair crosspoint across temp and voltage ranges per Figure 3.

9. Skew is measured between outputs under identical transition conditions @ 50 MHz.

10.Phase noise integrated from 12 kHz to 20 MHz.

Figure 3. AC Reference Measurement

CLK

CLK

Q

Q

525 mV

175 mV

525 mV

175 mV

(a) Propagation Delay and

Propagation Delay Variation

(c) VCROSS and DVCROSS

(b) tr, tf and Dtr, Dtf