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CAT6500 Datasheet(PDF) 4 Page - ON Semiconductor |
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CAT6500 Datasheet(HTML) 4 Page - ON Semiconductor |
4 / 13 page CAT6500 www.onsemi.com 4 Table 2. ABSOLUTE MAXIMUM RATINGS Parameter Symbol Pin Range Unit Input Voltage Range (Note 1) VPS PS1, PS2 −5.0 to 18 V VCC, VPWR_OUT VCC, C1, PWR_OUT −0.3 to 6.0 Control Logic Input Range VL_IN RM_ENx, PRIORITY −0.3 to 6.0 V Control Logic Output Range VL_OUT SW1_STAT, SW2_STAT −0.3 to 6.0 V Maximum Junction Temperature TJ(max) – 150 °C Storage Temperature Range TSTG – −65 to 150 °C ESD Capability, Human Body Model (Note 2) ESDHBM ALL 2 kV ESD Capability, Machine Model (Note 2) ESDMM ALL 200 V Lead Temperature Soldering Reflow (SMD Styles Only), Pb−Free Versions (Note 3) TSLD ALL 260 °C Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality should not be assumed, damage may occur and reliability may be affected. 1. Refer to ELECTRICAL CHARACTERISTICS and APPLICATION INFORMATION for Safe Operating Area. 2. This device series incorporates ESD protection and is tested by the following methods: ESD Human Body Model tested per AEC−Q100−002 (EIA/JESD22−A114) ESD Machine Model tested per AEC−Q100−003 (EIA/JESD22−A115) Latchup Current Maximum Rating: ≤ 150 mA per JEDEC standard: JESD78 3. For information, please refer to our Soldering and Mounting Techniques Reference Manual, SOLDERRM/D Table 3. THERMAL CHARACTERISTICS (Note 4) Parameter Symbol Value Unit Thermal Characteristics, TDFN−32 4.4 x 4.4 mm Thermal Resistance, Junction−to−Air, 1 sq. Inch, 1 oz. Copper Clad PCB Thermal Resistance, Junction−to−Air, 1 sq. Inch, 2 oz. Copper Clad PCB RθJA 59 54 °C/W 4. Values based on copper area of 645 mm2 (or 1 in2) of 1 oz copper thickness and FR4 PCB substrate. Table 4. RECOMMENDED OPERATING CONDITIONS Parameter Symbol Min Max Unit Input Voltage PS1, PS2 VCC 1.6 5.5 V VPWR_OUT 0 5.5 VPS1, VPS2 −5 7.7 Output Current IPWR_OUT 0 3.3 A Control Logic; Inputs and Outputs VL_IN, VL_OUT 0 5.5 V Ambient Temperature TA −40 +85 °C Functional operation above the stresses listed in the Recommended Operating Ranges is not implied. Extended exposure to stresses beyond the Recommended Operating Ranges limits may affect device reliability. |
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