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C11482GA Datasheet(PDF) 5 Page - Hamamatsu Corporation |
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C11482GA Datasheet(HTML) 5 Page - Hamamatsu Corporation |
5 / 8 page TG series Mini-spectrometer C11482GA 5 Dimensional outline (unit: mm) 38.5 16.0 105.5 Tolerance unless otherwise noted: ±0.5 Weight: 280 g 41.8 68.6 (2×) M3 tap depth 5.0 from backside Film thickness measurement (white light interferometry) Measurement example 0 40000 30000 20000 10000 Pixels 0 100 200 300 400 500 KACCB0095EA Thickness of 10 μm thick food wrapping film (polyvinylidene chloride) was measured. Note: Principle of film thickness measurement: In film thickness measurement utilizing white light interferometry, an interference spectrum resulting from internal reflections between the front and back surfaces of a film is obtained. The film thickness can then be determined by calculation from the spectral peak count, wavelength range, refractive index of film and incident light angle. KACCA0146EE |
Similar Part No. - C11482GA_15 |
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Similar Description - C11482GA_15 |
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