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MT4C1M16E5 Datasheet(PDF) 6 Page - Micron Technology

Part No. MT4C1M16E5
Description  EDO DRAM
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Manufacturer  MICRON [Micron Technology]
Direct Link  http://www.micron.com
Logo MICRON - Micron Technology

MT4C1M16E5 Datasheet(HTML) 6 Page - Micron Technology

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6
1 Meg x 16 EDO DRAM
Micron Technology, Inc., reserves the right to change products or specifications without notice.
D52_B.p65 – Rev. B; Pub. 3/01
©2001, Micron Technology, Inc
16Mb: 1 MEG x16
EDO DRAM
DC ELECTRICAL CHARACTERISTICS AND OPERATING CONDITIONS
(Notes: 1; notes appear on pages 10-11)
3.3V
5V
PARAMETER/CONDITION
SYMBOL
MIN
MAX
MIN
MAX
UNITS NOTES
SUPPLY VOLTAGE
VCC
3.0
3.6
4.5
5.5
V
INPUT HIGH VOLTAGE:
Valid Logic 1; All inputs, I/Os and any NC
VIH
2.0
5.5
2.4
VCC + 1
V
INPUT LOW VOLTAGE:
Valid Logic 0; All inputs, I/Os and any NC
VIL
-1.0
0.8
-0.5
0.8
V
INPUT LEAKAGE CURRENT:
Any input at VIN (0V
£ VIN £ VIH[MAX]);
II
-2
2
-2
2
µA
4
All other pins not under test = 0V
OUTPUT HIGH VOLTAGE:
IOUT = -2mA(3.3V), -5mA(5V)
VOH
2.4
2.4
V
OUTPUT LOW VOLTAGE:
IOUT = 2mA(3.3V), 4.2mA(5V)
VOL
0.4
0.4
V
OUTPUT LEAKAGE CURRENT:
Any output at VOUT (0V
£ VOUT £ 5.5V);
IOZ
-5
5
-5
5
µA
DQ is disabled and in High-Z state
ABSOLUTE MAXIMUM RATINGS*
Voltage on VCC Pin Relative to VSS
3.3V ......................................................... -1V to +4.6V
5V ............................................................... -1V to +7V
Voltage on NC, Inputs or I/O Pins Relative to Vss:
3.3V ......................................................... -1V to +5.5V
5V ............................................................... -1V to +7V
Operating Temperature
TA (commercial) .................................. 0ºC to +70ºC
TA (extended) ................................... -20ºC to +80ºC
Storage Temperature (plastic) ........... -55ºC to +150ºC
Power Dissipation ........................................................ 1W
Short Circuit Output Current ................................ 50mA
*Stresses greater than those listed under “Absolute
Maximum Ratings” may cause permanent damage to
the device. This is a stress rating only, and functional
operation of the device at these or any other conditions
above those indicated in the operational sections of
this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may
affect reliability.


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