CAV25010, CAV25020, CAV25040

http://onsemi.com

2

MARKING DIAGRAMS

25010E = CAV25010

25020E = CAV25020

25040E = CAV25040

A

= Assembly Location

Y

= Production Year (Last Digit)

M

= Production Month (1−9, O, N, D)

XXX = Last Three Digits of

G

= Pb−Free Package

25xx0E

AYMXXX

S01E = CAV25010

S02E = CAV25020

S04E = CAV25040

A

= Assembly Location

Y

= Production Year (Last Digit)

M

= Production Month (1−9, O, N, D)

XXX = Last Three Digits of

G

= Pb−Free Package

SxxE

AYMXXX

(SOIC−8)

(TSSOP−8)

G

G

Table 1. ABSOLUTE MAXIMUM RATINGS

Parameters

Ratings

Units

Operating Temperature

−45 to +130

°C

Storage Temperature

−65 to +150

°C

Voltage on any Pin with Respect to Ground (Note 1)

V

Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the

Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect

device reliability.

Symbol

Parameter

Min

Units

Endurance

1,000,000

Program / Erase Cycles

Data Retention

100

Years

Table 3. D.C. OPERATING CHARACTERISTICS

Symbol

Parameter

Test Conditions

Min

Max

Units

Supply Current (Read Mode)

2

mA

Supply Current (Write Mode)

2

mA

Standby Current

2

mA

Standby Current

5

mA

Input Leakage Current

−2

2

mA

Output Leakage Current

−1

2

mA

Input Low Voltage

−0.5

V

Input High Voltage

V

Output Low Voltage

0.4

V

Output High Voltage

V

Symbol

Test

Conditions

Min

Typ

Max

Units

Output Capacitance (SO)

8

pF

Input Capacitance (CS, SCK, SI, WP, HOLD)

8

pF

2. These parameters are tested initially and after a design or process change that affects the parameter according to appropriate AEC−Q100

and JEDEC test methods.