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CAV25010 Datasheet(PDF) 2 Page - ON Semiconductor |
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CAV25010 Datasheet(HTML) 2 Page - ON Semiconductor |
2 / 12 page CAV25010, CAV25020, CAV25040 http://onsemi.com 2 MARKING DIAGRAMS 25010E = CAV25010 25020E = CAV25020 25040E = CAV25040 A = Assembly Location Y = Production Year (Last Digit) M = Production Month (1−9, O, N, D) XXX = Last Three Digits of XXX = Assembly Lot Number G = Pb−Free Package 25xx0E AYMXXX S01E = CAV25010 S02E = CAV25020 S04E = CAV25040 A = Assembly Location Y = Production Year (Last Digit) M = Production Month (1−9, O, N, D) XXX = Last Three Digits of XXX = Assembly Lot Number G = Pb−Free Package SxxE AYMXXX (SOIC−8) (TSSOP−8) G G Table 1. ABSOLUTE MAXIMUM RATINGS Parameters Ratings Units Operating Temperature −45 to +130 °C Storage Temperature −65 to +150 °C Voltage on any Pin with Respect to Ground (Note 1) −0.5 to VCC + 0.5 V Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability. Table 2. RELIABILITY CHARACTERISTICS (Note 2) Symbol Parameter Min Units NEND (Note 3) Endurance 1,000,000 Program / Erase Cycles TDR Data Retention 100 Years Table 3. D.C. OPERATING CHARACTERISTICS (VCC = 2.5 V to 5.5 V, TA = −40°C to +125°C, unless otherwise specified.) Symbol Parameter Test Conditions Min Max Units ICCR Supply Current (Read Mode) Read, VCC = 5.5 V, 10 MHz, SO open 2 mA ICCW Supply Current (Write Mode) Write, VCC = 5.5 V, 10 MHz, SO open 2 mA ISB1 Standby Current VIN = GND or VCC, CS = VCC, WP = VCC, VCC = 5.5 V 2 mA ISB2 Standby Current VIN = GND or VCC, CS = VCC, WP = GND, VCC = 5.5 V 5 mA IL Input Leakage Current VIN = GND or VCC −2 2 mA ILO Output Leakage Current CS = VCC, VOUT = GND or VCC −1 2 mA VIL Input Low Voltage −0.5 0.3 VCC V VIH Input High Voltage 0.7 VCC VCC + 0.5 V VOL Output Low Voltage IOL = 3.0 mA 0.4 V VOH Output High Voltage IOH = −1.6 mA VCC − 0.8 V V Table 4. PIN CAPACITANCE (Note 2) (TA = 25°C, f = 1.0 MHz, VCC = +5.0 V) Symbol Test Conditions Min Typ Max Units COUT Output Capacitance (SO) VOUT = 0 V 8 pF CIN Input Capacitance (CS, SCK, SI, WP, HOLD) VIN = 0 V 8 pF 1. The DC input voltage on any pin should not be lower than −0.5 V or higher than VCC + 0.5 V. During transitions, the voltage on any pin may undershoot to no less than −1.5 V or overshoot to no more than VCC + 1.5 V, for periods of less than 20 ns. 2. These parameters are tested initially and after a design or process change that affects the parameter according to appropriate AEC−Q100 and JEDEC test methods. 3. Page Mode, VCC = 5 V, 25°C. |
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