LMV641

SNOSAW3C – SEPTEMBER 2007 – REVISED FEBRUARY 2013

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Absolute Maximum Ratings

(1) (2)

Human Body Model

2000V

Machine Model

200V

±0.3V

13.2V

Input/Output Pin Voltage

−0.3V

Storage Temperature Range

−65°C to +150°C

+150°C

Soldering Information

Infrared or Convection (20 sec)

235°C

Wave Soldering Lead Temp (10 sec)

260°C

(1)

Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for

which the device is intended to be functional, but specific performance is not guaranteed. For guaranteed specifications and the test

conditions, see the Electrical Characteristics Tables.

(2)

If Military/Aerospace specified devices are required, please contact the Texas Instruments Sales Office / Distributors for

availability and specifications.

(3)

Human Body Model, applicable std. MIL-STD-883, Method 3015.7. Machine Model, applicable std. JESD22-A115-A (ESD MM std. of

JEDEC)Field-Induced Charge-Device Model, applicable std. JESD22-C101-C (ESD FICDM std. of JEDEC).

(4)

Operating Ratings

(1)

−40°C to 125°C

2.7V to 12V

Package Thermal Resistance (

(2)

5-Pin SC70

456°C/W

8-Pin SOIC

166°C/W

5-Pin SOT-23

325°C/W

(1)

Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for

which the device is intended to be functional, but specific performance is not guaranteed. For guaranteed specifications and the test

conditions, see the Electrical Characteristics Tables.

(2)

2.7V DC Electrical Characteristics

Boldface limits apply at the temperature extremes.

Min

Typ

Max

Symbol

Parameter

Conditions

Units

(1)

(2)

(1)

30

500

µV

Input Offset Voltage

750

Input Offset Average Drift

0.1

μV/°C

75

95

nA

Input Bias Current

(3)

110

Input Offset Current

0.9

5

nA

89

114

CMRR

Common Mode Rejection Ratio

0V

dB

84

(1)

Limits are 100% production tested at 25°C. Limits over the operating temperature range are guaranteed through correlations using

Statistical Quality Control (SQC) method.

(2)

Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary

over time and will also depend on the application and configuration. The typical values are not tested and are not guaranteed on

shipped production material.

(3)

Positive current corresponds to current flowing into the device.

2

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