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IDT8N4S270 Datasheet(PDF) 9 Page - Integrated Device Technology |
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IDT8N4S270 Datasheet(HTML) 9 Page - Integrated Device Technology |
9 / 18 page IDT8N4S270 Data Sheet LVDS FREQUENCY-PROGRAMMABLE CRYSTAL OSCILLATOR IDT8N4S270CCD REVISION A AUGUST 31, 2012 9 ©2012 Integrated Device Technology, Inc. Parameter Measurement Information 2.5V LVDS Output Load AC Test Circuit RMS Phase Jitter Cycle-to-Cycle Jitter 3.3V LVDS Output Load AC Test Circuit RMS Period Jitter Output Duty Cycle/Pulse Width/Period SCOPE Q nQ 2.5V±5% POWER SUPPLY +– Float GND VDD Offset Frequency f 1 f 2 Phase Noise Plot Area Under Curve Defined by the Offset Frequency Markers RMS Phase Jitter = 2 * * ƒ 1 * nQ Q ➤ ➤ tcycle n tcycle n+1 tjit(cc) = |tcycle n – tcycle n+1| 1000 Cycles SCOPE Q nQ 3.3V±5% POWER SUPPLY +– Float GND VDD VOH VREF VOL Mean Period (First edge after trigger) Reference Point (Trigger Edge) 1 σ contains 68.26% of all measurements 2 σ contains 95.4% of all measurements 3 σ contains 99.73% of all measurements 4 σ contains 99.99366% of all measurements 6 σ contains (100-1.973x10-7)% of all measurements Histogram t PW t PERIOD t PW t PERIOD odc = x 100% nQ Q |
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