PMEG2020CPA

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© NXP B.V. 2010. All rights reserved.

Product data sheet

Rev. 1 — 5 August 2010

9 of 15

NXP Semiconductors

PMEG2020CPA

8.

Test information

The current ratings for the typical waveforms as shown in Figure 9, 10, 11 and 12 are

calculated according to the equations:

at DC, and

8.1 Quality information

This product has been qualified in accordance with the Automotive Electronics Council

(AEC) standard Q101 - Stress test qualification for discrete semiconductors, and is

suitable for use in automotive applications.

Fig 13. Reverse recovery time test circuit and waveforms

trr

(1)

t

output signal

t

10 %

90 %

input signal

D.U.T.

SAMPLING

OSCILLOSCOPE

mga881

Fig 14. Duty cycle definition

P

t

006aaa812

duty cycle

δ =

I

FAV

()

I

M

δ

×

=

I

RMS

I

FAV

()

=

I

RMS

I

M

δ

×

=