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86004I Datasheet(PDF) 4 Page - Integrated Device Technology

Part # 86004I
Description  CLK accepts the following input levels
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Manufacturer  IDT [Integrated Device Technology]
Direct Link  http://www.idt.com
Logo IDT - Integrated Device Technology

86004I Datasheet(HTML) 4 Page - Integrated Device Technology

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15.625MHZ to 62.5MHZ, 1:4 LVCMOS/
LVTTL Zero Delay Clock Buffer
86004I DATA SHEET
4
REVISION A 7/10/15
TABLE 5A. AC CHARACTERISTICS, V
DD
= V
DDA
= V
DDO
= 3.3V±5%, TA = -40°C TO 85°C
TABLE 4D. LVCMOS / LVTTL DC CHARACTERISTICS, V
DD
= V
DDA
= V
DDO
= 3.3V±5% OR 2.5V±5%, TA = -40°C TO 85°C
Symbol
Parameter
Test Conditions
Minimum
Typical
Maximum
Units
V
IH
Input High Voltage
V
DD
= 3.3V
2
V
DD
+ 0.3
V
V
DD
= 2.5V
1.7
V
DD
+ 0.3
V
V
IL
Input Low Voltage
V
DD
= 3.3V
-0.3
0.8
V
V
DD
= 2.5V
-0.3
0.7
V
I
IH
Input High Current
CLK, MR,
FB_IN, F_SEL
V
DD
= V
IN
= 3.465V
150
µA
PLL_SEL
V
DD
= V
IN
= 3.465V
5
µA
I
IL
Input Low Current
CLK, MR,
FB_IN, F_SEL
V
DD
= 3.465V, V
IN
= 0V
-5
µA
PLL_SEL
V
DD
= 3.465V, V
IN
= 0V
-150
µA
V
OH
Output High Voltage; NOTE 1
V
DDO
= 3.465V
2.6
V
V
DDO
= 2.625V
1.8
V
V
OL
Output Low Voltage; NOTE 1
V
DDO
= 3.465V or 2.625V
0.5
V
NOTE 1: Outputs terminated with 50W to V
DDO
/2. See Parameter Measurement Information Section,
Output Load Test Circuit diagrams.
Symbol
Parameter
Test Conditions
Minimum
Typical
Maximum
Units
f
MAX
Output Frequency
F_SEL = 0
31.25
62.5
MHz
F_SEL = 1
15.625
31.25
MHz
tp
LH
Propagation Delay, Low-to-High; NOTE 1
PLL_SEL = 0V,
Bypass Mode
4.1
6.1
ns
t(Ø)
Static Phase Offset; NOTE 2, 4
PLL_SEL = 3.3V
-500
500
ps
tsk(o)
Output Skew; NOTE 3, 4
PLL_SEL = 0V
65
ps
tjit(cc)
Cycle-to-Cycle Jitter; NOTE 4
75
ps
t
L
PLL Lock Time
1mS
t
R
/ t
F
Output Rise/Fall Time
0.4
1
ns
odc
Output Duty Cycle
49
51
%
All parameters measured at f
MAX
unless noted otherwise.
NOTE: Electrical parameters are guaranteed over the specified ambient operating temperature range, which is established
when the device is mounted in a test socket with maintained transverse airflow greater than 500 lfpm. The device will meet
specifications after thermal equilibrium has been reached under these conditions.
NOTE 1: Measured from V
DD
/2 of the input crossing point to the output at V
DDO
/2.
NOTE 2: Defined as the time difference between the input reference clock and the average feedback input signal
when the PLL is locked and the input reference frequency is stable.
NOTE 3: Defined as skew between outputs at the same supply voltages and with equal load conditions.
Measured at V
DDO
/2.
NOTE 4: This parameter is defined in accordance with JEDEC Standard 65.


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