ICS859S0412I Data Sheet

4:2, DIFFERENTIAL-TO-LVPECL/LVDS CLOCK MULTIPLEXER

ICS859S0412BGI REVISION A MAY 23, 2012

8

©2012 Integrated Device Technology, Inc.

NOTE: Electrical parameters are guaranteed over the specified ambient operating temperature range, which is established when the device

is mounted in a test socket with maintained transverse airflow greater than 500 lfpm. The device will meet specifications after thermal

equilibrium has been reached under these conditions.

NOTE 1: Measured from the differential input crossing point to the differential output crossing point.

NOTE 2: Defined as skew between outputs at the same supply voltage and with equal load conditions. Measured at the differential output

crossing point.

NOTE 3: These parameters are guaranteed by characterization. Not tested in production.

NOTE 4: Defined as skew between outputs on different devices operating a the same supply voltage, same temperature, same frequency and

with equal load conditions. Using the same type of input on each device, the output is measured at the differential cross points.

Using the same type of input on each device, the output is measured at the differential cross points.

NOTE: Electrical parameters are guaranteed over the specified ambient operating temperature range, which is established when the device

is mounted in a test socket with maintained transverse airflow greater than 500 lfpm. The device will meet specifications after thermal

equilibrium has been reached under these conditions.

NOTE 1: Measured from the differential input crossing point to the differential output crossing point.

NOTE 2: Defined as skew between outputs at the same supply voltage and with equal load conditions. Measured at the differential output

crossing point.

NOTE 3: These parameters are guaranteed by characterization. Not tested in production.

NOTE 4: Defined as skew between outputs on different devices operating a the same supply voltage, same temperature, same frequency and

with equal load conditions. Using the same type of input on each device, the output is measured at the differential cross points.

Using the same type of input on each device, the output is measured at the differential cross points.

Symbol

Parameter

Test Conditions

Minimum

Typical

Maximum

Units

Output Frequency

3GHz

Propagation Delay; NOTE 1

400

800

ps

tjit

Buffer Additive Phase Jitter, RMS;

refer to Additive Phase Jitter Section

100MHz, Integration Range:

12kHz – 20MHz

0.26

0.30

ps

tsk(o)

Output Skew; NOTE 2, 3

25

ps

tsk(pp)

Part-to-Part Skew; NOTE 3, 4

100

ps

Output Rise/Fall Time

20% to 80%

50

200

ps

odc

Output Duty Cycle

46

54

%

MUX Isolation

ƒOUT < 1.2GHz

45

dB

Symbol

Parameter

Test Conditions

Minimum

Typical

Maximum

Units

Output Frequency

3GHz

Propagation Delay; NOTE 1

400

800

ps

tjit

Buffer Additive Phase Jitter, RMS;

refer to Additive Phase Jitter Section

100MHz, Integration Range:

12kHz – 20MHz

0.26

0.31

ps

tsk(o)

Output Skew; NOTE 2, 3

25

ps

tsk(pp)

Part-to-Part Skew; NOTE 3, 4

100

ps

Output Rise/Fall Time

20% to 80%

50

200

ps

odc

Output Duty Cycle

46

54

%

MUX Isolation

ƒOUT < 1.2GHz

45

dB