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ATF-331M4 Datasheet(PDF) 3 Page - AVAGO TECHNOLOGIES LIMITED

Part No. ATF-331M4
Description  Low Noise Pseudomorphic HEMT in a Miniature Leadless Package
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Maker  AVAGO [AVAGO TECHNOLOGIES LIMITED]
Homepage  http://www.avagotech.com
Logo AVAGO - AVAGO TECHNOLOGIES LIMITED

ATF-331M4 Datasheet(HTML) 3 Page - AVAGO TECHNOLOGIES LIMITED

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ATF-331M4 DC Electrical Specifications
TA = 25°C, RF parameters measured in a test circuit for a typical device
Symbol
Parameter and Test Condition
Units
Min.
Typ.[2]
Max.
Idss[1]
Saturated Drain Current
Vds = 1.5 V, Vgs = 0V
mA
175
237
305
Vp[1]
Pinch-off Voltage
Vds = 1.5 V, Ids = 10% of Idss
V
-0.65
-0.5
-0.35
Id
Quiescent Bias Current
Vgs = -0.51 V, Vds = 4 V
mA
60
Gm[1] ]
Transconductance
Vds = 1.5 V, Gm = Idss/Vp
mmho
360
440
Igdo
Gate to Drain Leakage Current
Vgd = -5 V
A
1000
Igss
Gate Leakage Current
Vgd = Vgs = -4V
A
42
600
NF
Noise Figure
f = 2 GHz
f = 900 MHz
Vds = 4 V, Ids = 60 mA
Vds = 4 V, Ids = 60 mA
dB
dB
0.6
0.5
0.8
Ga
Associated Gain
f = 2 GHz
f = 900 MHz
Vds = 4 V, Ids = 60 mA
Vds = 4 V, Ids = 60 mA
dB
dB
13.5
15
21
16.5
OIP3
Output 3rd Order
Intercept Point [3]
f = 2 GHz,
5 dBm Pout/Tone
f = 900 MHz,
5 dBm Pout/Tone
Vds = 4 V, Ids = 60 mA
Vds = 4 V, Ids = 60 mA
dBm
dBm
28.5
31
30.8
P1dB
1dB Compressed
Output Power [3]
f = 2 GHz
f = 900 MHz
Vds = 4 V, Ids = 60 mA
Vds = 4 V, Ids = 60 mA
dBm
dBm
19
18
Notes:
1. Guaranteed at wafer probe level
2. Typical values are determined from a sample size of 349 parts from 4 wafers.
3. Measurements obtained using production test board described in Figure 5.
Input
50
Ω Input
Transmission Line
Including
Gate Bias T
(0.3 dB loss)
Input
Matching Circuit
Γ_mag = 0.13
Γ_ang = 113°
(0.3 dB loss)
50
Ω Output
Transmission Line
Including
Gate Bias T
(0.5 dB loss)
DUT
Output
Figure 5. Block diagram of 2 GHz production test board used for Noise Figure, Associated Gain, P1dB, and OIP3 measurements.
This circuit represents a trade-off between an optimal noise match and a realizable match based on production test requirements.
Circuit losses have been de-embedded from actual measurements.


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