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M13L2561616A-2A Datasheet(PDF) 10 Page - Elite Semiconductor Memory Technology Inc.

Part No. M13L2561616A-2A
Description  Double-data-rate architecture, two data transfers per clock cycle
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Maker  ESMT [Elite Semiconductor Memory Technology Inc.]
Homepage  http://www.esmt.com.tw/index.asp
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M13L2561616A-2A Datasheet(HTML) 10 Page - Elite Semiconductor Memory Technology Inc.

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ESMT
M13L2561616A (2A)
Elite Semiconductor Memory Technology Inc.
Publication Date : Sep. 2012
Revision : 1.0
10/49
AC Timing Parameter & Specifications – continued
-4
-5
-6
Parameter
Symbol
min
max
min
max
min
max
Unit
Note
Active to Precharge command
tRAS
36
70K
40
70K
42
70K
ns
Active to Active / Auto Refresh
command period
tRC
52
55
60
ns
Auto Refresh to Active / Auto Refresh
command period
tRFC
60
70
72
ns
Active to Read, Write delay
tRCD
15
15
18
ns
Precharge command period
tRP
15
15
18
ns
Active to Read with Auto Precharge
command
tRAP
15
15
18
ns
Active bank A to Active bank B
command
tRRD
8
10
12
ns
Write recovery time
tWR
15
15
15
ns
Write data in to Read command delay
tWTR
2
2
2
tCK
Average periodic refresh interval
tREFI
7.8
7.8
7.8
us
13
Write preamble
tWPRE
0.25
0.25
0.25
tCK
Write postamble
tWPST
0.4
0.6
0.4
0.6
0.4
0.6
tCK
11
Read preamble
tRPRE
0.9
1.1
0.9
1.1
0.9
1.1
tCK
Read postamble
tRPST
0.4
0.6
0.4
0.6
0.4
0.6
tCK
Clock to DQS write preamble setup time
tWPRES
0
0
0
ns
12
Mode Register Set command cycle time
tMRD
2
2
2
tCK
Exit self refresh to Read command
tXSRD
200
200
200
tCK
Exit self refresh to non-Read command
tXSNR
75
75
75
ns
Auto Precharge write
recovery+precharge time
tDAL
(tWR/tCK)
+
(tRP/tCK)
(tWR/tCK)
+
(tRP/tCK)
(tWR/tCK)
+
(tRP/tCK)
tCK
22
Notes:
1.
All voltages referenced to VSS.
2.
Tests for AC timing, IDD, and electrical, AC and DC characteristics, may be conducted at nominal reference/supply
voltage levels, but the related specifications and device operation are guaranteed for the full voltage range specified.
3.
The below figure represents the timing reference load used in defining the relevant timing parameters of the part. It is
not intended to be either a precise representation of the typical system environment nor a depiction of the actual load
presented by a production tester. System designers will use IBIS or other simulation tools to correlate the timing
reference load to a system environment. Manufacturers will correlate to their production test conditions (generally a
coaxial transmission line terminated at the tester electronics).


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