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NCV85081BDS50R4G Datasheet(PDF) 5 Page - ON Semiconductor |
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NCV85081BDS50R4G Datasheet(HTML) 5 Page - ON Semiconductor |
5 / 22 page NCV8508B http://onsemi.com 5 ELECTRICAL CHARACTERISTICS (−40°C ≤ TJ ≤ 125°C; 6.0 V ≤ VIN ≤ 28 V, 100 mA ≤ IOUT ≤ 150 mA, C2 = 1.0 mF, RDelay = 60 k; unless otherwise specified.) Characteristic Unit Max Typ Min Test Conditions WAKEUP OUTPUT (VIN = 14 V, IOUT = 5.0 mA) RESET HIGH to Wakeup Rising Delay Time NCV85082B RDELAY = 60 k, 50% RESET rising edge to 50% Wakeup edge RDELAY = 120 k 27 − 37.5 75 48 − ms ms Wakeup Response to Watchdog Input 50% WDI falling edge to 50% Wakeup falling edge − 0.1 5.0 ms Wakeup Response to RESET 50% RESET falling edge to 50% Wakeup falling edge VOUT = VOUT_NOM −> 90% of VOUT_NOM − 0.1 5.0 ms Output Low RLOAD = 10 k to VOUT, VOUT ≥ 1.0 V RLOAD = 5.1 k to VOUT, VOUT ≥ 1.0 V − 0.2 0.4 0.4 0.8 V Output High RLOAD = 10 k to GND RLOAD = 5.1 k to GND VOUT − 0.5 VOUT − 1.0 VOUT − 0.25 VOUT − 0.5 − V DELAY Output Voltage IDELAY = 50 mA. Note 4 − 1.25 − V 3. Measured when the output voltage has dropped 100 mV from the nominal value. (see Figure 12) 4. Current drain on the Delay pin directly affects the Delay Time, Wakeup Period, and the RESET to Wakeup Delay Time. |
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