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NCV8702SN33T1G Datasheet(PDF) 2 Page - ON Semiconductor

Part # NCV8702SN33T1G
Description  200 mA, Ultra-Low Quiescent Current, Ultra-Low Noise, LDO Linear Voltage Regulator
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Manufacturer  ONSEMI [ON Semiconductor]
Direct Link  http://www.onsemi.com
Logo ONSEMI - ON Semiconductor

NCV8702SN33T1G Datasheet(HTML) 2 Page - ON Semiconductor

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NCV8702
http://onsemi.com
2
Figure 2. Simplified Schematic Block Diagram
IN
OUT
ACTIVE
DISCHARGE
THERMAL
SHUTDOWN
UVLO
ENABLE
LOGIC
GND
EN
EN
BANDGAP
REFERENCE
MOSFET
DRIVER WITH
CURRENT LIMIT
AUTO LOW
POWER MODE
INTEGRATED
SOFT−START
EEPROM
+
Table 1. PIN FUNCTION DESCRIPTION
Pin No.
XDFN 6
Pin No.
TSOP−5
Pin
Name
Description
1
5
OUT
Regulated output voltage pin. A small 1 mF ceramic capacitor is needed from this pin to ground
to assure stability.
2
4
N/C
Not connected. This pin can be tied to ground to improve thermal dissipation.
3
2
GND
Power supply ground.
4
3
EN
Driving EN over 0.9 V turns on the regulator. Driving EN below 0.4 V puts the regulator into
shutdown mode.
5
N/C
Not connected. This pin can be tied to ground to improve thermal dissipation.
6
1
IN
Input pin. It is recommended to connect a 1 mF ceramic capacitor close to the device pin.
Table 2. ABSOLUTE MAXIMUM RATINGS
Rating
Symbol
Value
Unit
Input Voltage (Note 1)
VIN
−0.3 V to 6 V
V
Output Voltage
VOUT
−0.3 V to VIN + 0.3 V
V
Enable Input
VEN
−0.3 V to VIN + 0.3 V
V
Output Short Circuit Duration
tSC
Indefinite
s
Maximum Junction Temperature
TJ(MAX)
125
C
Storage Temperature
TSTG
−55 to 150
C
ESD Capability, Human Body Model (Note 2)
ESDHBM
2000
V
ESD Capability, Machine Model (Note 2)
ESDMM
200
V
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.
1. Refer to ELECTRICAL CHARACTERISTICS and APPLICATION INFORMATION for Safe Operating Area.
2. This device series incorporates ESD protection and is tested by the following methods:
ESD Human Body Model tested per AEC−Q100−002 (EIA/JESD22−A114)
ESD Machine Model tested per AEC−Q100−003 (EIA/JESD22−A115)
Latchup Current Maximum Rating tested per JEDEC standard: JESD78.


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