PYA28C256E-15LM datasheet(4/14 Pages) PYRAMID

Part #	PYA28C256E-15LM

Description	Access Times of 150, 200, 250 and 350ns Software Data Protection

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Manufacturer	PYRAMID [Pyramid Semiconductor Corporation]

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PYA28C256 - 32K x 8 EEPROM

Page 4

Document # EEPROM104 REV 03

DC ELECTRICAL CHARACTERISTICS

(Over Recommended Operating Temperature & Supply Voltage)(2)

Sym Parameter

Value

Unit

V

CC

Power Supply Pin with

Respect to GND

-0.3 to +6.25

V

TERM

Terminal Voltage with

Respect to GND (up to

6.25V)

-0.5 to +6.25

V

T

A

Operating Temperature

-55 to +125

°C

T

BIAS

Temperature Under Bias

-55 to +125

°C

T

STG

Storage Temperature

-65 to +150

°C

P

T

Power Dissipation

1.0

W

I

OUT

DC Output Current

50

mA

MAxIMUM RATIngS(1)

RECOMMEnDED OPERATIng COnDITIOnS

grade(2)

Ambient Temp

gnD

V

CC

Military

-55°C to +125°C

0V

5.0V ± 10%

CAPACITAnCES(4)

(V

CC = 5.0V, TA = 25°C, f = 1.0MHz)

Sym

Parameter

Conditions Typ Unit

C

IN

Input Capacitance

V

IN = 0V

10

pF

C

OUT

Output Capacitance

V

OUT = 0V

10

pF

Sym Parameter

Test Conditions

PYA28C010

Unit

Min

Max

V

IH

Input High Voltage

2.0

V

CC + 0.3

V

IL

Input Low Voltage

-0.5(3)

0.8

V

HC

CMOS Input High Voltage

V

CC - 0.2

V

CC + 0.5

V

LC

CMOS Input Low Voltage

-0.5(3)

0.2

V

OL

Output Low Voltage (TTL Load)

I

OL = +2.1 mA, VCC = Min

0.45

V

OH

Output High Voltage (TTL Load)

I

OH = -0.4 mA, VCC = Min

2.4

V

I

LI

Input Leakage Current

V

CC = Max

V

IN = GND to VCC

-10

+10

µA

I

LO

Output Leakage Current

V

CC = Max, CE = VIH,

V

OUT = GND to VCC

-10

+10

µA

I

SB

Standby Power Supply Current (TTL Input Levels)

CE ≥ V

IH, OE = VIL,

V

CC = Max,

f = Max, Outputs Open

—

3

mA

I

SB1

Standby Power Supply Current (CMOS Input Levels)

CE ≥ V

HC,

V

CC = Max,

f = 0, Outputs Open,

V

IN ≤ VLC or VIN ≥ VHC

—

300

µA

I

CC

Supply Current

CE = OE = V

IL,

WE = V

IH,

All I/O's = Open,

Inputs = V

CC = 5.5V

—

60

mA

notes:

1. Stresses greater than those listed under MAxIMuM RAtINGS may

cause permanent damage to the device. This is a stress rating only

and functional operation of the device at these or any other conditions

above those indicated in the operational sections of this specification

is not implied. Exposure to MAxIMUM rating conditions for extended

periods may affect reliability.

2. Extended temperature operation guaranteed with 400 linear feet per

minute of air flow.

3.TransientinputswithV

IL and IIL not more negative than -3.0V and -100mA,

respectively, are permissible for pulse widths up to 20ns.

4. This parameter is sampled and not 100% tested.

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