P3C1256L85SNMLF datasheet(6/11 Pages) PYRAMID

Part #	P3C1256L85SNMLF

Description	LOW POWER 32K x 8 STATIC CMOS RAM

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Manufacturer	PYRAMID [Pyramid Semiconductor Corporation]

Direct Link	http://www.pyramidsemiconductor.com

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P3C1256L - 32K x 8 STATIC CMOS RAM

Page 6

Document # SRAM143 REV A

AC TEST COnDITIOnS

TRUTH TABLE

TIMIng WAVEFORM OF WRITE CyCLE nO. 2 (CE COnTROLLED)(10)

Input Pulse Levels

GND to 3.0V

Input Rise and Fall Times

3ns

Input Timing Reference Level

1.5V

Output Timing Reference Level

1.5V

Output Load

See Figures 1 and 2

Mode

CE

OE

WE

I/O

Power

Standby

H

x

High Z

Standby

x

High Z

Standby

D

OUT Disabled

L

H

High Z

Active

Read

L

H

D

OUT

Active

Write

L

x

L

High Z

Active

Figure 1. Output Load

Figure 2. Thevenin Equivalent

* including scope and test fixture.

note:

Because of the high speed of the P3C1256L, care must be taken when

testing this device; an inadequate setup can cause a normal function-

ing part to be rejected as faulty. Long high-inductance leads that cause

supply bounce must be avoided by bringing the V

CC and ground planes

directly up to the contactor fingers. A 0.01 µF high frequency capacitor

is also required between V

CC and ground. To avoid signal reflections,

proper termination must be used; for example, a 50Ω test environment

should be terminated into a 50Ω load with 1.77V (Thevenin Voltage) at

the comparator input, and a 589Ω resistor must be used in series with

D

OUT to match 639Ω (Thevenin Resistance).

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P3C1256L85SNMLF Datasheet(PDF) 6 Page - Pyramid Semiconductor Corporation

P3C1256L85SNMLF Datasheet(HTML) 6 Page - Pyramid Semiconductor Corporation

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