TS19371 datasheet(2/8 Pages) TSC

Part #	TS19371

Description	Boost (Step-up) WLED Driver with OVP

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Manufacturer	TSC [Taiwan Semiconductor Company, Ltd]

Direct Link	http://www.taiwansemi.com

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2 / 8 page

TS19371

Boost (Step-up) WLED Driver with OVP

2/8

Version: H14

Absolute Maximum Rating

(Note 1)

Parameter

Symbol

Limit

Unit

Input Voltage

VIN

20

V

Supply Voltage (Recommended)

VIN

2.5 ~ 18

V

FB Voltage

VFB

10

V

SW Voltage

VSW

36

V

CTRL Voltage

VCTRL

10

V

Ambient Temperature Range

TA

-40 to +85

oC

Junction Temperature Range

TJ

-40 to +125

oC

Electrical Specifications (TC = 25

oC, V

IN= VCTRL=3V, CIN=1uF, COUT=0.22μF unless otherwise noted)

Parameter

Symbol

Test Conditions

Min

Typ

Max

Units

Input Voltage Range

VIN

2.5

--

18

V

Feedback Voltage

VFB

ISW=180mA,

VIN=5V

80

95

110

mV

FB Pin Bias Current

IB

10

45

100

nA

Supply Current

IQ

--

2.1

3.0

mA

CTRL=0V

--

0.1

1.0

μA

Switching Frequency

FRSW

0.8

1.2

1.6

MHz

Switch Current Limit

ICL

--

650

--

mA

Maximum Duty Cycle

DTMX

85

90

--

%

Switch VCESAT

VSAT

At ISW= 250mA

--

350

--

mV

Switch Leakage Current

ILKG

VSW=5V

--

0.01

5

μA

Voltage Enable Control

VCTL

High

1.5

--

V

Low

--

0.4

V

CTRL Pin Bias Current

ICTL

Ctrl=2V

--

65

--

μA

Over Voltage Protection

OVP

--

30

--

V

Thermal Information

(Note 2)

Parameter

Symbol

Test Conditions

Min

Typ

Max

Units

Thermal Resistance - Junction to Ambient

RӨJA

--

220

--

°C/W

Note 1: Absolute maximum ratings are limits beyond which damage to the device may occur.

Note 2: The maximum allowable power dissipation is a function of maximum function temperature, TJ(max), the

junction to ambient thermal resistance, RθJA, and the ambient temperature. The maximum allowable, power

dissipation at any ambient temperature is calculated using: PD(MAX)=[TJ(max)-TA]/RθJA . Exceeding the maximum

allowable power dissipation will cause excessive die temperature. All limits at temperature extremes are

guaranteed via correlation using standard statistical methods.

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