MACHLV210-12 datasheet(9/29 Pages) LATTICE

Part #	MACHLV210-12

Description	High Density EE CMOS Programmable Logic

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Manufacturer	LATTICE [Lattice Semiconductor]

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9

MACHLV210-12 (Com’l)

ABSOLUTE MAXIMUM RATINGS

Storage Temperature

–65

°C to +150°C

. . . . . . . . . . .

Ambient Temperature

with Power Applied

–55

°C to +125°C

. . . . . . . . . . . . .

Supply Voltage with

Respect to Ground

–0.5 V to +5.0 V

. . . . . . . . . . . . .

DC Input Voltage

–0.5 V to VCC + 0.5 V

. . . . . . . . . . .

DC Output or

I/O Pin Voltage

–0.5 V to VCC + 0.5 V

. . . . . . . . . . . .

Static Discharge Voltage

2001 V

. . . . . . . . . . . . . . . . .

Latchup Current (TA = 0

°C to +70°C)

200 mA

. . . . . .

Stresses above those listed under Absolute Maximum Ratings

may cause permanent device failure. Functionality at or above

these limits is not implied. Exposure to Absolute Maximum

Ratings for extended periods may affect device reliability.

Programming conditions may differ.

OPERATING RANGES

Commercial (C) Devices

Temperature (TA) Operating

in Free Air

0

°C to +70°C

. . . . . . . . . . . . . . . . . . . . . . .

Supply Voltage (VCC) with

Respect to Ground

+3.0 V to +3.6 V

. . . . . . . . . . . . . .

Operating ranges define those limits between which the func-

tionality of the device is guaranteed.

DC CHARACTERISTICS over COMMERCIAL operating ranges unless otherwise specified

Parameter

Symbol

Parameter Description

Test Conditions

Min

Typ

Max

Unit

VOH

Output HIGH Voltage

IOH = –2 mA, VCC = Min

2.4

V

VIN = VIH or VIL

VOL

Output LOW Voltage

IOL = 2 mA, VCC = Min

0.4

V

VIN = VIH or VIL

VIH

Input HIGH Voltage

Guaranteed Input Logical HIGH

2.0

V

Voltage for all Inputs (Note 1)

VIL

Input LOW Voltage

Guaranteed Input Logical LOW

0.8

V

Voltage for all Inputs (Note 1)

IIH

Input HIGH Leakage Current

VIN = 3.6 V, VCC = Max (Note 2)

10

µA

IIL

Input LOW Leakage Current

VIN = 0 V, VCC = Max (Note 2)

–10

µA

IOZH

Off-State Output Leakage

VOUT = 3.6 V, VCC = Max

10

µA

Current HIGH

VIN = VIH or VIL (Note 2)

IOZL

Off-State Output Leakage

VOUT = 0 V, VCC = Max

–10

µA

Current LOW

VIN = VIH or VIL (Note 2)

ISC

Output Short-Circuit Current

VOUT = 0.5 V, VCC = Max (Note 3)

–30

–160

mA

ICC

Supply Current (Typical)

VCC = 3.3 V, TA = 25

°C, f = 0 MHz

2

mA

f = 25 MHz

60

mA

Notes:

1. These are absolute values with respect to device ground and all overshoots due to system or tester noise are included.

2. I/O pin leakage is the worst case of IIL and IOZL (or IIH and IOZH).

3. Not more than one output should be shorted at a time and duration of the short-circuit should not exceed one second.

VOUT = 0.5 V has been chosen to avoid test problems caused by tester ground degradation.

4. Measured with a 16-bit up/down counter pattern. This pattern is programmed in each PAL block and is capable of being

loaded, enabled, and reset.

(Note 4)

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