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AN578 Datasheet(PDF) 3 Page - STMicroelectronics |
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AN578 Datasheet(HTML) 3 Page - STMicroelectronics |
3 / 5 page 3/5 AN578 ANALYSIS Table 1. Operating Region Definition Table 1 shows the range of the three operating regions, while Figure 4, which illustrates region C, allows us to determine the destruction time limit of each device versus the current through the structure (RMS current at 25°C). Figure 4. Characteristics of Region C (With Vgate = -48 V) CONCLUSION Figure 4: The devices in the LCPxxx family have common characteristics, divided into three regions: a) Clamping mode, still functional after 15 minutes b) Crowbar mode (firing) still functional after 15 minutes of test at 25°C c) Crowbar mode, with a destruction time defined by Figure 4. The given curves enable the appropriate series elements to be chosen, for example a PTC device. OPERATING REGION LCP 150 LCP 1512 LCP 1511 A/clamping 0 to 70 mA * O to 70 mA * O to 70 mA * B/non destructive region 0.07 to 2 A * 0.07 to 1.2A* 0.07 to 0.8A * C/destructive region Over 2 A * Over 1.2 A * Over 0.8 A * * RMS current LCP150 / 1511 / 1512 0,5 1 2 5 10 20 50 100 0,5 1 2 5 10 20 t(S) I(Arms) LCP150 LCP1512 LCP1511 |
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