ADN2814_15 datasheet(12/28 Pages) AD

Part #	ADN2814

Description	Data Recovery IC with Integrated Limiting Amp

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ADN2814

Data Sheet

Rev. C | Page 12 of 28

TERMINOLOGY

Input Sensitivity and Input Overdrive

Sensitivity and overdrive specifications for the quantizer involve

offset voltage, gain, and noise. The relationship between the

logic output of the quantizer and the analog voltage input is

shown in Figure 12. For sufficiently large positive input voltage,

the output is always Logic 1, and similarly for negative inputs,

the output is always Logic 0. However, the transitions between

output Logic Level 1 and output Logic Level 0 are not at

precisely defined input voltage levels, but occur over a range of

input voltages. Within this range of input voltages, the output

may be either 1 or 0, or it may even fail to attain a valid logic

state. The width of this zone is determined by the input voltage

noise of the quantizer. The center of the zone is the quantizer

input offset voltage. Input overdrive is the magnitude of signal

required to guarantee the correct logic level with 1 × 10−10

confidence level.

NOISE

OUTPUT

INPUT (V p-p)

OFFSET

OVERDRIVE

SENSITIVITY

(2

× OVERDRIVE)

1

0

Figure 12. Input Sensitivity and Input Overdrive

Single-Ended vs. Differential

AC coupling is typically used to drive the inputs to the

quantizer. The inputs are internally dc biased to a common-

mode potential of ~2.5 V. Driving the ADN2814 single-ended

and observing the quantizer input with an oscilloscope probe at

the point indicated in Figure 13 shows a binary signal with an

average value equal to the common-mode potential and

instantaneous values both above and below the average value.

It is convenient to measure the peak-to-peak amplitude of this

signal and call the minimum required value the quantizer

sensitivity. Referring to Figure 13, because both positive and

negative offsets need to be accommodated, the sensitivity is

twice the overdrive. The ADN2814 quantizer typically has

3.3 mV p-p sensitivity.

SCOPE

PROBE

50

Ω

3k

Ω

2.5V

50

Ω

VREF

ADN2814

QUANTIZER

+

–

10mV p-p

VREF

Figure 13. Single-Ended Sensitivity Measurement

Driving the ADN2814 differentially (see Figure 14), sensitivity

seems to improve from observing the quantizer input with an

oscilloscope probe. This is an illusion caused by the use of a

single-ended probe. A 5 mV p-p signal appears to drive the

ADN2814 quantizer. However, the single-ended probe measures

only half the signal. The true quantizer input signal is twice this

value, because the other quantizer input is a complementary

signal to the signal being observed.

SCOPE

PROBE

50

Ω

3k

Ω

2.5V

50

Ω

VREF

QUANTIZER

+

–

NIN

5mV p-p

VREF

5mV p-p

VREF

Figure 14. Differential Sensitivity Measurement

LOS Response Time

LOS response time is the delay between removal of the input

signal and indication of loss of signal (LOS) at the LOS output,

Pin 22. When the inputs are dc-coupled, the LOS assert time of

the AD2814 is 500 ns typical and the deassert time is 400 ns

typical. In practice, the time constant produced by the ac

coupling at the quantizer input and the 50 Ω on-chip input

termination determines the LOS response time.

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