ADM1062_15 datasheet(24/36 Pages) AD

Part #	ADM1062

Description	Super Sequencer with Margining Control and Temperature Monitoring

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Manufacturer	AD [Analog Devices]

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ADM1062

Rev. C | Page 24 of 36

TEMPERATURE MEASUREMENT SYSTEM

The ADM1062 contains an on-chip, band gap temperature

sensor whose output is digitized by the on-chip, 12-bit ADC.

Theoretically, the temperature sensor and the ADC can measure

temperatures from −128°C to +128°C with a resolution of 0.125°C.

Because this exceeds the operating temperature range of the device,

local temperature measurements outside this range are not possible.

Temperature measurements from −128°C to +128°C are possible

using a remote sensor. The output code is in offset binary format,

with −128°C given by Code 0x400, 0°C given by Code 0x800,

and +128°C given by Code 0xC00.

As with the other analog inputs to the ADC, a limit register is

provided for each of the temperature input channels. Therefore,

a temperature limit can be set such that if it is exceeded, a warning

is generated and available as an input to the sequencing engine.

This enables users to control their sequence or monitor functions

based on an overtemperature or undertemperature event.

REMOTE TEMPERATURE MEASUREMENT

The ADM1062 can measure the temperature of a remote diode

sensor or diode-connected transistor connected to Pin DN and

Pin DP (Pin 37 and Pin 38 on the LFCSP package and Pin 44

and Pin 45 on the TQFP package).

The forward voltage of a diode or diode-connected transistor

operated at a constant current exhibits a negative temperature

coefficient of about −2 mV/°C. Unfortunately, the absolute value

of VBE varies from device to device, and individual calibration

is required to null it, making the technique unsuitable for mass

production. The technique used in the ADM1062 is to measure

the change in VBE when the device is operated at two different

currents.

The change in VBE is given by

Δ

VBE = kT/q × ln(N)

where:

k is Boltzmann’s constant.

q is the charge on the carrier.

T is the absolute temperature in Kelvin.

N is the ratio of the two currents.

Figure 36 shows the input signal conditioning used to measure the

output of a remote temperature sensor. This figure shows the

external sensor as a substrate transistor provided for temperature

monitoring on some microprocessors, but it could equally be

a discrete transistor such as a 2N3904 or 2N3906.

If a discrete transistor is used, the collector is not grounded and

should be linked to the base. If a PNP transistor is used, the base

is connected to the DN input, and the emitter is connected to

the DP input. If an NPN transistor is used, the emitter is connected

to the DN input, and the base is connected to the DP input.

Figure 34 and Figure 35 show how to connect the ADM1062 to

an NPN or PNP transistor for temperature measurement. To

prevent ground noise from interfering with the measurement,

the more negative terminal of the sensor is not referenced to

ground but is biased above ground by an internal diode at the

DN input.

2N3904

NPN

ADM1062

DP

DN

Figure 34. Measuring Temperature Using an NPN Transistor

2N3906

PNP

ADM1062

DP

DN

Figure 35. Measuring Temperature Using a PNP Transistor

CPU

BIAS

DIODE

VDD

TO ADC

VOUT+

VOUT–

REMOTE

SENSING

TRANSISTOR

I

N× I

IBIAS

LOW-PASS FILTER

fC = 65kHz

THERM DA

THERM DC

DP

DN

Figure 36. Signal Conditioning for Remote Diode Temperature Sensors

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