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ADE7757 Datasheet(PDF) 4 Page - Analog Devices |
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ADE7757 Datasheet(HTML) 4 Page - Analog Devices |
4 / 16 page REV. A –4– ADE7757 CAUTION ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on the human body and test equipment and can discharge without detection. Although the ADE7757 features proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance degradation or loss of functionality. ABSOLUTE MAXIMUM RATINGS 1 (TA = 25 °C, unless otherwise noted.) VDD to AGND . . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +7 V VDD to DGND . . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +7 V Analog Input Voltage to AGND V1P, V1N, V2P, and V2N . . . . . . . . . . . . . . . . –6 V to +6 V Reference Input Voltage to AGND . . . –0.3 V to VDD + 0.3 V Digital Input Voltage to DGND . . . . . –0.3 V to VDD + 0.3 V Digital Output Voltage to DGND . . . . –0.3 V to VDD + 0.3 V Operating Temperature Range Industrial (A, B Versions) . . . . . . . . . . . . . –40 °C to +85°C Storage Temperature Range . . . . . . . . . . . . –65 °C to +150°C Junction Temperature . . . . . . . . . . . . . . . . . . . . . . . . . . 150 °C 16-Lead Plastic SOIC, Power Dissipation . . . . . . . . . 350 mW JA Thermal Impedance 2 . . . . . . . . . . . . . . . . . . . 124.9 °C/W Lead Temperature, Soldering Vapor Phase (60 sec) . . . . . . . . . . . . . . . . . . . . . . . . . 215 °C Infrared (15 sec) . . . . . . . . . . . . . . . . . . . . . . . . . . . . 220 °C NOTES 1 Stresses above those listed under Absolute Maximum Ratings may cause perma- nent damage to the device. This is a stress rating only; functional operation of the device at these or any other conditions above those listed in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. 2 JEDEC 1S Standard (2-layer) Board Data. ORDERING GUIDE Model Package Description Package Options ADE7757ARN SOIC Narrow-Body RN-16 ADE7757ARNRL SOIC Narrow-Body RN-16 in Reel EVAL-ADE7757EB Evaluation Board Evaluation Board ADE7757ARN-REF Reference Design Reference Design TERMINOLOGY Measurement Error The error associated with the energy measurement made by the ADE7757 is defined by the following formula % – Error Energy Registered by ADE True Energy True Energy = 7757 ¥100% Phase Error between Channels The HPF (high-pass filter) in the current channel (Channel V1) has a phase lead response. To offset this phase response and equalize the phase response between channels, a phase correc- tion network is also placed in Channel V1. The phase correction network matches the phase to within ±0.1° over a range of 45 Hz to 65 Hz, and ±0.2° over a range 40 Hz to 1 kHz (see Figures 11 and 12). Power Supply Rejection This quantifies the ADE7757 measurement error as a percent- age of reading when the power supplies are varied. For the ac PSR measurement, a reading at nominal supplies (5 V) is taken. A 200 mV rms/100 Hz signal is then introduced onto the supplies and a second reading is obtained under the same input signal levels. Any error introduced is expressed as a percentage of reading—see the Measurement Error definition. For the dc PSR measurement, a reading at nominal supplies (5 V) is taken. The supplies are then varied ±5% and a second reading is obtained with the same input signal levels. Any error introduced is again expressed as a percentage of reading. ADC Offset Error This refers to the small dc signal (offset) associated with the analog inputs to the ADCs. However, the HPF in Channel V1 eliminates the offset in the circuitry. Therefore, the power cal- culation is not affected by this offset. Frequency Output Error (CF) The frequency output error of the ADE7757 is defined as the difference between the measured output frequency (minus the offset) and the ideal output frequency. The difference is expressed as a percentage of the ideal frequency. The ideal frequency is obtained from the ADE7757 transfer function (see the Transfer Function section). Gain Error The gain error of the ADE7757 is defined as the difference between the measured output frequency (minus the offset) and the ideal output frequency. The difference is expressed as a percentage of the ideal frequency. The ideal frequency is obtained from the ADE7757 transfer function (see the Transfer Function section). Oscillator Frequency Tolerance The oscillator frequency tolerance of the ADE7757 is defined as part-to-part frequency variation in terms of percentage at room temperature (25 °C). It is measured by taking the difference between the measured oscillator frequency and the nominal frequency defined in the Specifications section. Oscillator Frequency Stability Oscillator frequency stability is defined as frequency variation in terms of parts-per-million drift over the operating tem- perature range. In a metering application, the temperature range is –40 °C to +85°C. Oscillator frequency stability is measured by taking the difference between the measured oscillator frequency at –40 °C and +85°C and the measured oscillator frequency at +25 °C. |
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