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HI1-0508A-8 Datasheet(PDF) 7 Page - Intersil Corporation |
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HI1-0508A-8 Datasheet(HTML) 7 Page - Intersil Corporation |
7 / 15 page 7 Absolute Maximum Ratings Thermal Information V+ to V- . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +44V V+ to GND . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +22V V- to GND. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -25V Digital Input Voltage (VEN, VA) . . . . . . . . . . . . . (V-) -4V to (V+) +4V or 20mA, Whichever Occurs First Analog Signal (VIN, VOUT). . . . . . . . . . . . . . . (V-) -20V to (V+) +20V Continuous Current, IN or OUT . . . . . . . . . . . . . . . . . . . . . . . . 20mA Peak Current, IN or OUT, Pulsed 1ms, 10% Duty Cycle (Max). . 40mA Operating Conditions Temperature Ranges HI-506A/507A/508A/509A-2, -8 . . . . . . . . . . . . . . -55oC to 125oC HI-506A/507A/508A/509A-5, -7 . . . . . . . . . . . . . . . . . 0oC to 75oC Thermal Resistance (Typical, Note 1) θJA (oC/W) θJC (oC/W) 28 Ld CERDIP Package . . . . . . . . . . . . 55 18 16 Ld CERDIP Package . . . . . . . . . . . . 85 32 28 Ld PDIP Package . . . . . . . . . . . . . . 60 N/A 16 Ld PDIP Package . . . . . . . . . . . . . . 90 N/A Maximum Junction Temperature CERDIP Packages . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .175oC PDIP Packages . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .150oC Maximum Storage Temperature Range . . . . . . . . . . -65oC to 150oC Maximum Lead Temperature (Soldering 10s) . . . . . . . . . . . . .300oC CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. NOTE: 1. θJA is measured with the component mounted on an evaluation PC board in free air. Electrical Specifications Supplies = +15V, -15V; VREF Pin = Open; VAH (Logic Level High) = 4V; VAL (Logic Level Low) = 0.8V, Unless Otherwise Specified. For Test Conditions, Consult Test Circuits Section PARAMETER TEST CONDITIONS TEMP (oC) -2, -8 -5, -7 UNITS MIN TYP MAX MIN TYP MAX DYNAMIC CHARACTERISTICS Access Time, tA Note 2 25 - 0.5 - - 0.5 - µs Full - - 1.0 - - 1.0 µs Break-Before-Make Delay, tOPEN Note 2 25 25 80 - 25 80 - ns Enable Delay (ON), tON(EN) Note 2 25 - 300 500 - 300 - ns Full - - 1000 - - 1000 ns Enable Delay (OFF), tOFF(EN) Note 2 25 - 300 500 - 300 - ns Full - - 1000 - - 1000 ns Settling Time, tS HI-506A and HI-507A To 0.1% 25 - 1.2 - - 1.2 - µs To 0.01% 25 - 3.5 - - 3.5 - µs HI-508A and HI-509A To 0.1% 25 - 1.2 - - 1.2 - µs To 0.01% 25 - 3.5 - - 3.5 - µs Off Isolation Note 7 25 50 68 - 50 68 - dB Channel Input Capacitance, CS(OFF) 25 -10- -10- pF Channel Output Capacitance, CD(OFF) HI-506A 25 - 52 - - 52 - pF HI-507A 25 - 30 - - 30 - pF HI-508A 25 - 25 - - 25 - pF HI-509A 25 - 12 - - 12 - pF Digital Input Capacitance, CA 25 -10- -10- pF Input to Output Capacitance, CDS(OFF) 25 - 0.1 - - 0.1 - pF DIGITAL INPUT CHARACTERISTICS Input Low Threshold, TTL Drive, VAL Note 2 Full - - 0.8 - - 0.8 V Input High Threshold, VAH (Note 9) Note 2 Full 4.0 - - 4.0 - - V Input Leakage Current (High or Low), IA Notes 2, 6 Full - - 1.0 - - 1.0 µA HI-506A, HI-507A, HI-508A, HI-509A |
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