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HCTS390MS Datasheet(PDF) 6 Page - Intersil Corporation

Part No. HCTS390MS
Description  Radiation Hardened Dual Decade Ripple Counter
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Maker  INTERSIL [Intersil Corporation]
Homepage  http://www.intersil.com/cda/home
Logo INTERSIL - Intersil Corporation

HCTS390MS Datasheet(HTML) 6 Page - Intersil Corporation

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Specifications HCTS390MS
TABLE 6. APPLICABLE SUBGROUPS
CONFORMANCE GROUPS
METHOD
GROUP A SUBGROUPS
READ AND RECORD
Initial Test (Preburn-In)
100%/5004
1, 7, 9
ICC, IOL/H
Interim Test I (Postburn-In)
100%/5004
1, 7, 9
ICC, IOL/H
Interim Test II (Postburn-In)
100%/5004
1, 7, 9
ICC, IOL/H
PDA
100%/5004
1, 7, 9, Deltas
Interim Test III (Postburn-In)
100%/5004
1, 7, 9
ICC, IOL/H
PDA
100%/5004
1, 7, 9, Deltas
Final Test
100%/5004
2, 3, 8A, 8B, 10, 11
Group A (Note 1)
Sample/5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11
Group B
Subgroup B-5
Sample/5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas
Subgroups 1, 2, 3, 9, 10, 11
Subgroup B-6
Sample/5005
1, 7, 9
Group D
Sample/5005
1, 7, 9
NOTE: 1. Alternate Group A in accordance with Method 5005 of MIL-STD-883 may be exercised.
TABLE 7. TOTAL DOSE IRRADIATION
CONFORMANCE
GROUPS
METHOD
TEST
READ AND RECORD
PRE RAD
POST RAD
PRE RAD
POST RAD
Group E Subgroup 2
5005
1, 7, 9
Table 4
1, 7, 9
Table 4 (Note 1)
NOTE: 1. Except FN test which will be performed 100% Go/No-Go.
TABLE 8. STATIC AND DYNAMIC BURN-IN TEST CONNECTIONS
OPEN
GROUND
1/2 VCC = 3V
± 0.5V
VCC = 6V
± 0.5V
OSCILLATOR
50kHz
25kHz
STATIC BURN-IN I TEST CONNECTIONS (Note 1)
3, 5 - 7, 9 - 11, 13
1, 2, 4, 8,12, 14, 15
-
16
-
-
STATIC BURN-IN II TEST CONNECTIONS (Note 1)
3, 5 - 7, 9 - 11, 13
8
-
1, 2, 4, 12, 14 - 16
-
-
DYNAMIC BURN-IN TEST CONNECTIONS (Note 2)
-
8
3, 5 - 7, 9 - 11, 13
2, 14, 16
1, 4, 12, 15
-
NOTES:
1. Each pin except VCC and GND will have a resistor of 10k
Ω± 5% for static burn-in
2. Each pin except VCC and GND will have a resistor of 680
Ω± 5% for dynamic burn-in
TABLE 9. IRRADIATION TEST CONNECTIONS
OPEN
GROUND
VCC = 5V
± 0.5V
3, 5 - 7, 9 - 11, 13
8
1, 2, 4, 12, 14 - 16
NOTE: Each pin except VCC and GND will have a resistor of 47K
Ω± 5% for irradiation testing.
Group E, Subgroup 2, sample size is 4 dice/wafer 0 failures.
Spec Number
518634


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