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HCTS02MS Datasheet(PDF) 5 Page - Intersil Corporation |
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HCTS02MS Datasheet(HTML) 5 Page - Intersil Corporation |
5 / 11 page 5 Specifications HCTS02MS TABLE 8. STATIC AND DYNAMIC BURN-IN TEST CONNECTIONS OPEN GROUND 1/2 VCC = 3V ± 0.5V VCC = 6V ± 0.5V OSCILLATOR 50kHz 25kHz STATIC BURN-IN I TEST CONDITIONS (Note 1) 1, 4, 10, 13 2, 3, 5, 6, 7, 8, 9, 11, 12 - 14 - - STATIC BURN-IN II TEST CONNECTIONS (Note 1) 1, 4, 10, 13 7 - 2, 3, 5, 6, 8, 9, 11, 12, 14 -- DYNAMIC BURN-IN I TEST CONNECTIONS (Note 2) - 7 1, 4, 10, 13 14 2, 3, 5, 6, 8, 9, 11, 12 - NOTES: 1. Each pin except VCC and GND will have a resistor of 10K Ω± 5% static burn-in. 2. Each Pin except VCC and GND will have a resistor of 1k Ω± 5% for dynamic burn-in. TABLE 9. IRRADIATION TEST CONNECTIONS OPEN GROUND VCC = 5V ± 0.5V 1, 4, 10, 13 7 2, 3, 5, 6, 8, 9, 11, 12, 14 NOTE: Each pin except VCC and GND will have a resistor of 47K Ω± 5% for irradiation testing. Group E, Subgroup 2, sample size is 4 dice/wafer 0 failures. Spec Number 518841 |
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