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HA5340 Datasheet(PDF) 4 Page - Intersil Corporation

Part No. HA5340
Description  High Speed, Low Distortion, Precision Monolithic Sample and Hold Amplifier
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Maker  INTERSIL [Intersil Corporation]
Homepage  http://www.intersil.com/cda/home
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 4 page
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7-11
Specifications HA5340/883
TABLE 3. ELECTRICAL PERFORMANCE CHARACTERISTICS
PARAMETER
SYMBOL
CONDITIONS
NOTES
TEMPERATURE
LIMITS
UNITS
MIN
MAX
Hold Mode Feedthrough
VHMF
VIN = 20VP-P, 200kHz
1
+25oC
-
-70
dB
Sample Mode Noise
Voltage
En(SAMPLE)
DC to 10MHz, VS/H = 0V,
RLOAD = 2K
1
+25oC
-
335
µV
RMS
Hold Mode Noise
Voltage
En(HOLD)
DC to 10MHz, VS/H = 5V,
RLOAD = 2K
1
+25oC
-
100
µV
RMS
Input Capacitance
CIN
VS/H = 0V
1
+25oC-
5
pF
Input Resistance
RIN
VS/H = 0V, Delta VIN = 20V
1
+25oC1
-
M
0.1% Acquisition Time
TACQ 0.1%
CL = 60pF, RL = 2K, VOUT = 0V
to 10V Step
1
+25oC
-
600
ns
Total Harmonic
Distortion Hold Mode
THD200K(HOLD)
FS = 450kHz,
VIN = 20VP-P, 200kHz
1
+25oC
-
-50
dBc
THD500K(HOLD)
FS = 450kHz,
VIN = 5VP-P, 500kHz
1
+25oC
-
-47
dBc
Total Harmonic
Distortion Sample Mode
THD200K(SAMPLE)
VIN = 20VP-P, 200kHz
1
+25oC
-
-60
dBc
THD500K(SAMPLE)
VIN = 5VP-P, 500kHz
1
+25oC
-
-49
dBc
NOTE:
1. The parameters listed in this table are controlled via design or process parameters and are not directly tested. These parameters are
characterized upon initial design release and upon design changes which would affect these characteristics.
TABLE 4. ELECTRICAL TEST REQUIREMENTS
MIL-STD-883 TEST REQUIREMENTS
SUBGROUPS (SEE TABLES 1 AND 2)
Interim Electrical Parameters (Pre Burn-In)
-
Final Electrical Test Parameters
1(Note 1), 2, 3, 4, 5, 6
Group A Test Requirements
1, 2, 3, 4, 5, 6
Groups C and D Endpoints
1
NOTE:
1. PDA applies to Subgroup 1 only. No other subgroups are included in PDA.
CAUTION: These devices are sensitive to electronic discharge. Proper IC handling procedures should be followed.
Spec Number
511117-883




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