 |
Electronic Components Datasheet Search |
|
|
Electronic Components Datasheet Search |
|
CTS20MS Datasheet(PDF) 5 Page - Intersil Corporation |
|
||||||||||||||||||||||||||||||
CTS20MS Datasheet(HTML) 5 Page - Intersil Corporation |
|
|
5 / 9 page 
424 Specifications HCTS20MS TABLE 8. STATIC AND DYNAMIC BURN-IN TEST CONNECTIONS OPEN GROUND 1/2 VCC = 3V ± 0.5V VCC = 6V ± 0.5V OSCILLATOR 50kHz 25kHz STATIC BURN-IN I TEST CONNECTIONS (Note 1) 3, 6, 8, 11 1, 2, 4, 5, 7, 9, 10, 12, 13 - 14 - - STATIC BURN-IN II TEST CONNECTIONS (Note 1) 3, 6, 8, 11 7 - 1, 2, 4, 5, 9, 10, 12, 13, 14 -- DYNAMIC BURN-IN TEST CONNECTIONS (Note 2) - 7 3, 6, 8, 11 14 1, 2, 4, 5, 9, 10, 12, 13 - NOTES: 1. Each pin except VCC and GND will have a resistor of 10K Ω± 5% for static burn-in 2. Each pin except VCC and GND will have a resistor of 1K Ω± 5% for dynamic burn-in TABLE 9. IRRADIATION TEST CONNECTIONS OPEN GROUND VCC = 5V ± 0.5V 3, 6, 8, 11 7 1, 2, 4, 5, 9, 10, 12, 13, 14 NOTE: Each pin except VCC and GND will have a resistor of 47K Ω± 5% for irradiation testing. Group E, Subgroup 2, sample size is 4 dice/wafer 0 failures. Spec Number 518619 |
English ▼
Chinese
German
Japanese
Russian
Korean
Spanish
French
Italian
Portuguese
Polish
Vietnamese
