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IDT79R3051E-40MJ Datasheet(PDF) 11 Page - Integrated Device Technology |
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IDT79R3051E-40MJ Datasheet(HTML) 11 Page - Integrated Device Technology |
11 / 23 page 5.3 11 IDT79R3051/79R3052 INTEGRATED RISControllers COMMERCIAL TEMPERATURE RANGE RECOMMENDED OPERATING TEMPERATURE AND SUPPLY VOLTAGE OUTPUT LOADING FOR AC TESTING ABSOLUTE MAXIMUM RATINGS (1, 3) Symbol Rating Commercial Unit VTERM Terminal Voltage –0.5 to +7.0 V with Respect to GND TC Operating Case 0 to +85 °C Temperature TBIAS Temperature –55 to +125 °C Under Bias TSTG Storage –55 to +125 °C Temperature VIN Input Voltage –0.5 to +7.0 V NOTES: 2874 tbl 04 1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability. 2. VIN minimum = –3.0V for pulse width less than 15ns. VIN should not exceed VCC +0.5V. 3. Not more than one output should be shorted at a time. Duration of the short should not exceed 30 seconds. Symbol Parameter Min. Max. Unit VIH Input HIGH Voltage 3.0 — V VIL Input LOW Voltage — 0 V VIHS Input HIGH Voltage 3.5 — V VILS Input LOW Voltage — 0 V AC TEST CONDITIONS 2874 tbl 05 Grade Temperature GND VCC Commercial 0 °C to +85°C 0V 5.0 ±5% (Case) 2874 tbl 06 DC ELECTRICAL CHARACTERISTICS (TC = 0 °C to +85°C, VCC = +5.0V ±5%) NOTES: 1. VIL Min. = –3.0V for pulse width less than 15ns. VIL should not fall below –0.5V for larger periods. 2. VIHS and VILS apply to CIk2xIn and Reset. 3. VIH should not be held above VCC + 0.5V. 4. Guaranteed by design. 20MHz 25MHz 33.33MHz 40MHz Symbol Parameter Test Conditions Min. Max. Min. Max. Min. Max. Min. Max. Unit VOH Output HIGH Voltage VCC = Min., IOH = –4mA 3.5 — 3.5 — 3.5 — 3.5 — V VOL Output LOW Voltage VCC = Min., IOL = 4mA — 0.4 — 0.4 — 0.4 — 0.4 V VIH Input HIGH Voltage(3) — 2.0 — 2.0 — 2.0 — 2.0 — V VIL Input LOW Voltage(1) — — 0.8 — 0.8 — 0.8 — 0.8 V VIHS Input HIGH Voltage(2,3) — 3.0 — 3.0 — 3.0 — 3.0 — V VILS Input LOW Voltage(1,2) — — 0.4 — 0.4 — 0.4 — 0.4 V CIN Input Capacitance(4) — — 10 — 10 — 10 — 10 pF COUT Output Capacitance(4) — — 10 — 10 — 10 — 10 pF ICC Operating Current VCC = 5V, TC = 25 °C — 350 — 400 — 450 — 500 mA IIH Input HIGH Leakage VIH = VCC — 100 — 100 — 100 — 100 µA IIL Input LOW Leakage VIL = GND –100 — –100 — –100 — –100 — µA IOZ Output Tri-state Leakage VOH = 2.4V, VOL = 0.5V –100 100 –100 100 –100 100 –100 100 µA 2874 tbl 07 – + To Device Under Test 25pF –4mA +4mA VREF +1.5V 2874 drw 08 |
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