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IDT74FCT646CSOB Datasheet(PDF) 4 Page - Integrated Device Technology |
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IDT74FCT646CSOB Datasheet(HTML) 4 Page - Integrated Device Technology |
4 / 8 page 7.18 4 IDT54/74FCT646/A/C FAST CMOS OCTAL TRANSCEIVER/REGISTER MILITARY AND COMMERCIAL TEMPERATURE RANGES ABSOLUTE MAXIMUM RATINGS (1) Symbol Rating Commercial Military Unit VTERM (2) Terminal Voltage –0.5 to +7.0 –0.5 to +7.0 V with Respect to GND VTERM (3) Terminal Voltage –0.5 to VCC –0.5 to VCC V with Respect to GND TA Operating 0 to +70 –55 to +125 °C Temperature TBIAS Temperature –55 to +125 –65 to +135 °C Under Bias TSTG Storage –55 to +125 –65 to +150 °C Temperature PT Power Dissipation 0.5 0.5 W IOUT DC Output Current 120 120 mA NOTES: 2536 tbl 03 1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability. No terminal voltage may exceed VCC by +0.5V unless otherwise noted. 2. Inputs and VCC terminals only. 3. Outputs and I/O terminals only. CAPACITANCE (TA = +25 °C, f = 1.0MHz) Symbol Parameter (1) Conditions Typ. Max. Unit CIN Input Capacitance VIN = 0V 6 10 pF CI/O I/O Capacitance VOUT = 0V 8 12 pF NOTE: 2536 tbl 04 1. This parameter is measured at characterization but not tested. DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE Following Conditions Apply Unless Otherwise Specified: VLC = 0.2V; VHC = VCC – 0.2V Commercial: TA = 0 °C to +70°C, VCC = 5.0V ± 5%; Military: TA = –55°C to +125°C, VCC = 5.0V ± 10% Symbol Parameter Test Conditions (1) Min. Typ. (2) Max. Unit VIH Input HIGH Level Guaranteed Logic HIGH Level 2.0 — — V VIL Input LOW Level Guaranteed Logic LOW Level — — 0.8 V IIH Input HIGH Current VCC = Max. VI = VCC —— 5 µA (Except I/O pins) VI = 2.7V — — 5 (4) IIL Input LOW Current VI = 0.5V — — –5 (4) (Except I/O pins) VI = GND — — –5 IIH Input HIGH Current VCC = Max. VI = VCC —— 15 µA (I/O pins only) VI = 2.7V — — 15 (4) IIL Input LOW Current VI = 0.5V — — –15 (4) (I/O pins only) VI = GND — — –15 VIK Clamp Diode Voltage VCC = Min., IN = –18mA — –0.7 –1.2 V IOS Short Circuit Current VCC = Max. (3), VO = GND –60 –120 — mA VOH Output HIGH Voltage VCC = 3V, VIN = VLC or VHC, IOH = –32 µAVHC VCC —V VCC = Min. IOH = –300 µAVHC VCC — VIN = VIH or VIL IOH = –12mA MIL. 2.4 4.0 — IOH = –15mA COM’L. 2.4 4.0 — VOL Output LOW Voltage VCC = 3V, VIN = VLC or VHC, IOL = 300 µA — GND VLC V VCC = Min. IOL = 300 µA — GND VLC (4) VIN = VIH or VIL IOL = 48mA MIL. — 0.3 0.55 IOL = 64mA COM’L. — 0.3 0.55 NOTES: 2536 tbl 05 1. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type. 2. Typical values are at VCC = 5.0V, +25 °C ambient and maximum loading. 3. Not more than one output should be shorted at one time. Duration of the short circuit test should not exceed one second. 4. This parameter is guaranteed but not tested. |
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