IDT74FCT646SOB datasheet(4/8 Pages) IDT

Part #	IDT74FCT646SOB

Description	FAST CMOS OCTAL TRANSCEIVER/REGISTER

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Manufacturer	IDT [Integrated Device Technology]

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IDT54/74FCT646/A/C

FAST CMOS OCTAL TRANSCEIVER/REGISTER

MILITARY AND COMMERCIAL TEMPERATURE RANGES

ABSOLUTE MAXIMUM RATINGS

(1)

Symbol

Rating

Commercial

Military

Unit

VTERM

(2) Terminal Voltage

–0.5 to +7.0

V

with Respect

to GND

VTERM

(3) Terminal Voltage

–0.5 to VCC

V

with Respect

to GND

TA

Operating

0 to +70

–55 to +125

°C

Temperature

TBIAS

Temperature

–55 to +125

–65 to +135

°C

Under Bias

TSTG

Storage

–55 to +125

–65 to +150

°C

Temperature

PT

Power Dissipation

0.5

W

IOUT

DC Output Current

120

mA

NOTES:

2536 tbl 03

1. Stresses greater than those listed under ABSOLUTE MAXIMUM

RATINGS may cause permanent damage to the device. This is a stress

rating only and functional operation of the device at these or any other

conditions above those indicated in the operational sections of this

specification is not implied.

Exposure to absolute maximum rating

conditions for extended periods may affect reliability. No terminal voltage

may exceed VCC by +0.5V unless otherwise noted.

2. Inputs and VCC terminals only.

3. Outputs and I/O terminals only.

CAPACITANCE (TA = +25

°C, f = 1.0MHz)

Symbol

Parameter

(1)

Conditions

Typ. Max. Unit

CIN

Input Capacitance

VIN = 0V

6

10

pF

CI/O

I/O Capacitance

VOUT = 0V

8

12

pF

NOTE:

2536 tbl 04

1. This parameter is measured at characterization but not tested.

DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE

Following Conditions Apply Unless Otherwise Specified: VLC = 0.2V; VHC = VCC – 0.2V

Commercial: TA = 0

°C to +70°C, VCC = 5.0V ± 5%; Military: TA = –55°C to +125°C, VCC = 5.0V ± 10%

Symbol

Parameter

Test Conditions

(1)

Min.

Typ.

(2)

Max.

Unit

VIH

Input HIGH Level

Guaranteed Logic HIGH Level

2.0

—

V

VIL

Input LOW Level

Guaranteed Logic LOW Level

—

0.8

V

IIH

Input HIGH Current

VCC = Max.

VI = VCC

——

5

µA

(Except I/O pins)

VI = 2.7V

—

5

(4)

IIL

Input LOW Current

VI = 0.5V

—

–5

(4)

(Except I/O pins)

VI = GND

—

–5

IIH

Input HIGH Current

VCC = Max.

VI = VCC

——

15

µA

(I/O pins only)

VI = 2.7V

—

15

(4)

IIL

Input LOW Current

VI = 0.5V

—

–15

(4)

(I/O pins only)

VI = GND

—

–15

VIK

Clamp Diode Voltage

VCC = Min., IN = –18mA

—

–0.7

–1.2

V

IOS

Short Circuit Current

VCC = Max.

(3), VO = GND

–60

–120

—

mA

VOH

Output HIGH Voltage

VCC = 3V, VIN = VLC or VHC, IOH = –32

µAVHC

VCC

—V

VCC = Min.

IOH = –300

µAVHC

VCC

—

VIN = VIH or VIL

IOH = –12mA MIL.

2.4

4.0

—

IOH = –15mA COM’L.

2.4

4.0

—

VOL

Output LOW Voltage

VCC = 3V, VIN = VLC or VHC, IOL = 300

µA

—

GND

VLC

V

VCC = Min.

IOL = 300

µA

—

GND

VLC

(4)

VIN = VIH or VIL

IOL = 48mA MIL.

—

0.3

0.55

IOL = 64mA COM’L.

—

0.3

0.55

NOTES:

2536 tbl 05

1. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type.

2. Typical values are at VCC = 5.0V, +25

°C ambient and maximum loading.

3. Not more than one output should be shorted at one time. Duration of the short circuit test should not exceed one second.

4. This parameter is guaranteed but not tested.

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